Search

Your search keyword '"Mellor, Christopher J."' showing total 2 results

Search Constraints

Start Over You searched for: Author "Mellor, Christopher J." Remove constraint Author: "Mellor, Christopher J." Topic atomic force microscopy Remove constraint Topic: atomic force microscopy
2 results on '"Mellor, Christopher J."'

Search Results

1. Effect of Probe Quality Factor on the Sensitivity of Variable Temperature Magnetic Force Microscopy.

2. High-temperature molecular beam epitaxy of hexagonal boron nitride layers.

Catalog

Books, media, physical & digital resources