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The frequency response of an atomic force microscope silicon cantilever located in a vacuum cryostat chamber was investigated. The resonance frequency and the peak width were extracted by a Lorentzian fit of the resonance curves for different sample temperatures (15–310 K). Frequency shifts significantly less than one could expect from known temperature dependencies of Young’s modulus and the density of silicon were found. The estimations described in this article show that the temperature of a silicon cantilever is mainly defined by the temperature of its holder, mainly due to the thermal conductivity of silicon. Thermal radiation emission plays a minor role in cooling the cantilever. Furthermore, heat transport through tip-sample contact, as well as contact with the environmental gas, could be neglected. [ABSTRACT FROM AUTHOR]

We demonstrate quantitative magnetic field mapping with nanoscale resolution, by applying a lock-in technique on the electron spin resonance frequency of a single nitrogen-vacancy defect placed at the apex of an atomic force microscope tip. In addition, we report an all-optical magnetic imaging technique which is sensitive to large off-axis magnetic fields, thus extending the operation range of diamond-based magnetometry. Both techniques are illustrated by using a magnetic hard disk as a test sample. Owing to the non-perturbing and quantitative nature of the magnetic probe, this work should open up numerous perspectives in nanomagnetism and spintronics. [ABSTRACT FROM AUTHOR]