1. Thickness-dependent bending modulus of hexagonal boron nitride nanosheets.
- Author
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Chun Li, Yoshio Bando, Chunyi Zhi, Yang Huang, and Dmitri Golberg
- Subjects
BORON nitride ,NANOSTRUCTURED materials ,CHEMICAL peel ,ATOMIC force microscopy ,SILICA ,MICROFABRICATION ,ELECTRON beam lithography ,CRYSTALS - Abstract
Bending modulus of exfoliation-made single-crystalline hexagonal boron nitride nanosheets (BNNSs) with thicknesses of 25-300 nm and sizes of 1.2-3.0 um were measured using three-point bending tests in an atomic force microscope. BNNSs suspended on an SiO2 trench were clamped by a metal film via microfabrication based on electron beam lithography. Calculated by the plate theory of a doubly clamped plate under a concentrated load, the bending modulus of BNNSs was found to increase with the decrease of sheet thickness and approach the theoretical C33 value of a hexagonal BN single crystal in thinner sheets (thickness<50 nm). The thickness-dependent bending modulus was suggested to be due to the layer distribution of stacking faults which were also thought to be responsible for the layer-by-layer BNNS exfoliation. [ABSTRACT FROM AUTHOR]
- Published
- 2009
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