1. EXAFS analysis of nanocrystallization process in Fe85Zr7B6Cu2 alloys by using cumulant method
- Author
-
Y. Swilem, E. Sobczak, Anna Ślawska-Waniewska, and R. Nietubyć
- Subjects
X-ray spectroscopy ,Amorphous metal ,Materials science ,Extended X-ray absorption fine structure ,Condensed matter physics ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,law.invention ,Grain growth ,Nanocrystal ,law ,Grain boundary ,Electrical and Electronic Engineering ,Absorption (chemistry) ,Crystallization - Abstract
The cumulant method is a model-independent technique based on the expansion of extended X-ray absorption fine structure (EXAFS) amplitudes and phases as a series of cumulants of the interatomic distance distribution. Results show evidence of simple grain boundary formed as amorphous–crystal interface region around BCC Fe nanocrystals. This interface region initially growth along with the growth of the Fe nanocrystals. However, in the latter stage of nanocrystallization, additional contribution of statically disordered interface is formed in nanograin boundaries hindering the grain growth. The disordered interfacial regions can help to explain nanocrystallization phenomenon of Fe85Zr7B6Cu2 alloys.
- Published
- 2005