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Abstract: The motivation behind this study was the urge to understand how the high strain rate flyer plate impact affects the nanohardness of alumina ceramics. Therefore, the load controlled nanoindentation experiments were conducted with a Berkovich indenter on an as received coarse grain (~10μm), high density (~3.98g.cm3) alumina and the shock recovered tiny fragments of the same alumina. The shocked alumina fragments were obtained from an earlier flyer plate shock impact study in a two stage gas gun. The nanohardness of the as received alumina was much higher than that of the shocked alumina. The shocked alumina showed a relatively much stronger indentation size effect (ISE) while the as received alumina exhibited a mild ISE. A new explanation was given for the presence of the relatively strong ISE in the shock recovered alumina. Additional characterizations such as scanning electron microscopy, field emission scanning electron microscopy, transmission electron microscopy and analysis of the experimental load depth data were utilized for this purpose. Finally, a new, qualitative model was proposed to provide a rational picture of the nanoindentation responses of the as received and shocked alumina ceramics. [Copyright &y& Elsevier]

To understand how high-strain rate, flyer-plate impact affects the nanohardness of a coarse (~10 μm) grain, high-density (~3.978 gm cc) alumina, load controlled nanoindentation experiments were conducted with a Berkovich indenter on as-sintered disks and shock-recovered alumina fragments obtained from an earlier flyer-plate shock impact study. The nanohardness of the shock-recovered alumina was much lower than that of the as-sintered alumina. The indentation size effect was severe in the shock-recovered alumina but only mild in the as-sintered alumina. Extensive additional characterization by field emission scanning electron microscopy, transmission electron microscopy, and analysis of the experimental load depth data were used to provide a new explanation for the presence of strong indentation size effect in the shock-recovered alumina. Finally, a qualitative model was proposed to provide a rationale for the whole scenario of nanoindentation responses in the as-sintered and shock-recovered alumina ceramics. [ABSTRACT FROM AUTHOR]

Abstract: Alumina thin films were deposited on titanium (Ti) and fused quartz by both direct and reactive pulsed rf magnetron sputtering techniques. X-ray diffraction, field emission scanning electron microscopy, energy dispersive X-ray spectroscopy and atomic force microscopy were utilized to study the phases and surface morphology of the films. The as-deposited alumina thin films were amorphous. However, after annealing at 500°C in vacuum, the crystalline peaks corresponding to the Theta (θ), Delta (δ) and Chi (χ) alumina phases were obtained. The optical transmittance and reflectance as well as IR emittance data were also evaluated for the thin films. The transmittance, e.g., (~90%) of the bare quartz substrate was not changed even when the alumina thin films were deposited for an hour. However, further increase in deposition time (e.g., 7h) of the alumina thin films showed only a marginal decrease (e.g., ~5%) in average transmittance of the bare quartz substrate. The direct and indirect optical band gaps and extinction coefficient of the alumina films were estimated from the transmittance spectra. The IR emittance of the Ti substrate (e.g., ~16%) was almost constant after depositing alumina thin films for an hour. Further increase in deposition time showed only a marginal increase (e.g., ~9%) in IR emittance value. Therefore, it is proposed that the alumina films developed in the present work can act as a protective cover for the Ti substrate while retaining the thermo-optical properties of the same. The nanohardness and Young׳s modulus of the alumina thin films were evaluated by the novel nanoindentation technique. The nanohardness was measured as ~6GPa. Further, Young׳s modulus was evaluated as ~116GPa. The magnitudes of the nanomechanical properties of the thin films were a little smaller than those reported in the literature. This was linked to the lack of crystalline phases in the as-deposited alumina thin films. [Copyright &y& Elsevier]