1. Reliability of connected-(r, s)-out-of-(m, n): F system.
- Author
-
Noguchi, Keiichi, Sasaki, Masafumi, Yanagi, Shigeru, and Yuge, Tetsushi
- Subjects
- *
RELIABILITY in engineering , *RECURSIVE functions , *ALGORITHMS , *RADIOSCOPIC diagnosis , *SYSTEMS engineering , *DETECTORS , *SENSOR networks - Abstract
A connected-(r, s)-out-of-(m, n): F system, which is defined as a two-dimensional version of a consecutive-k-out-of-n: F system, is used as a reliability evaluation model for a sensor system, an X-ray diagnostic system, a pattern search system, etc. This system consists of m × n components arranged like an (m, n) matrix and fails if the system has an (r, s) submatrix that contains all failed components. This paper presents a method of obtaining reliability of a connected-(r, s)-out-of-n: F system recursively. Some numerical examples are presented to show the relationship between component reliability and system reliability. © 1997 Scripta Technica, Inc. Electron Comm Jpn Pt 3, 80(1): 27–35, 1997 [ABSTRACT FROM AUTHOR]
- Published
- 1997
- Full Text
- View/download PDF