1. Spectral probing of carrier traps in Si-Ge alloy nanocrystals.
- Author
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Ha, Ngo Ngoc, Giang, NguyEN Truong, Khiem, Tran Ngoc, Dung, NguyEN Duc, and Gregorkiewicz, Tom
- Subjects
NANOCRYSTALS ,SPUTTERING (Physics) ,ABSORPTION ,IONIZATION energy ,EMISSIVITY - Abstract
Photogenerated carriers in Si-Ge alloy nanocrystals (NCs) prepared by co-sputtering method were investigated by mean of transient induced absorption. The carrier relaxation features multiple components, with three decay life times of τ ≈ 600 fs, 12 ps, and 15 ns, established for Si
0.2 Ge0.8 alloy NCs of a mean crystal size of 9 nm and standard deviation of 3 nm. Deep carrier traps, identified at the boundary between the NCs and the SiO2 host with the ionization energy of about 1 eV, are characterized by a long-range Coulombic potential. These are responsible for rapid depletion of free carrier population within a few picoseconds after the excitation, which explains the low emissivity of the investigated materials, and also sheds light on the generally low luminescence of Si/Ge and Ge NCs. (© 2016 WILEY-VCH Verlag GmbH &Co. KGaA, Weinheim) [ABSTRACT FROM AUTHOR]- Published
- 2016
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