1. Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2 , MoSe2 , WS2 and WSe2.
- Author
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Yue Niu, Gonzalez-Abad, Sergio, Frisenda, Riccardo, Marauhn, Philipp, Drüppel, Matthias, Gant, Patricia, Schmidt, Robert, Taghavi, Najme S., Barcons, David, Molina-Mendoza, Aday J., de Vasconcellos, Steffen Michaelis, Bratschitsch, Rudolf, De Lara, David Perez, Rohlfing, Michael, and Castellanos-Gomez, Andres
- Subjects
MICROSCOPY ,NANOSTRUCTURED materials ,REFLECTANCE spectroscopy - Abstract
The research field of two dimensional (
2 D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of2 D semiconducting transition metal dichalcogenides (TMDCs), MoS2 , MoSe2 , WS2 , and WSe2 , with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2 , MoSe2 , WS2 , and WSe2 . [ABSTRACT FROM AUTHOR]- Published
- 2018
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