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In this paper we explain the temperature dependence of excitonic effective mass and charge carrier conduction mechanism occurs in CH3NH3PbI3−xClx thin films prepared by chemical dip coating (CDC), spray pyrolysis (Spray) and repeated dipping-withdrawing (Dipping). Hall Effect study confirmed that prepared CH3NH3PbI3−xClx samples are p-type semiconductor having carrier concentration of the order of ~ 1016 cm−3. The charge carrier mobility, mean free path and mean free life time were found to decrease with increasing temperature due to polaronic effect. The excitonic effective mass is estimated to (0.090–0.196)me and excitonic binding energy (15–33) meV, well consistent with Wannier-Mott hydrogenic model and the nature of exciton is likely to be Mott-Wannier type. From electrical measurement, it was observed that charge carrier conduction in CH3NH3PbI3−xClx is governed by migration of $${\mathrm{I}}^{-}$$ I - and CH3N $${\mathrm{H}}_{3}^{+}$$ H 3 + vacancies and vacancy-assisted diffusion processes depending on temperature.

In this paper, Ba-doped SnO2 (SnO2:Ba), Mg-doped SnO2 (SnO2:Mg) and Ce-doped SnO2 (SnO2:Ce) nanostructured thin films were prepared on the glass substrate via a simple and low-cost nebulizer spray pyrolysis method. The crystal structure and morphology of all the samples were investigated by X-ray diffraction (XRD) and field-emission-scanning electron microscopy (FE-SEM), respectively. XRD results suggest that all the samples are polycrystalline with the tetragonal rutile structure. FE-SEM analysis exhibits a uniform surface morphology with homogenous distribution of grains. The transmittance measurement suggests that SnO2:Ba sample exhibits high transparency above 90% in the visible region. We find that doping causes an increase in the band gap, this behavior is explained by the Burstein–Moss effect. Two emission bands in the ultraviolet and visible regions are observed in the photoluminescence spectra. Hall effect measurement reveals that all the samples are degenerate and exhibit n-type semiconducting nature with carrier concentration in the order of 1018 cm−3. Ba doping induces the lowest resistivity of 0.047 Ω·cm associated with an increase in carrier concentration of 8.38 × 1018 cm−3 and mobility of 15.87 cm2 V−1 s−1. In contrast, the incorporation of Mg and Ce in SnO2 reduces the mobility and conductivity, which may be associated with the grain boundary scattering.

Intermetallic compounds with CaAl2Si2-type structure have been studied extensively due to their exciting set of physical properties. Among various alumo-germanides, MgAl2Ge2 is the new representative of CaAl2Si2-type structures. Our previous study explores the structural aspects, mechanical behaviors and electronic features of intermetallic MgAl2Ge2. The present work discloses the results of optoelectronic, thermodynamic and vibrational properties of MgAl2Ge2 via density functional theory-based investigations. The band structure calculations suggest that MgAl2Ge2 possesses slight electronic anisotropy and the compound is metallic. The Fermi surface topology reveals that both electron- and hole-like sheets are present in MgAl2Ge2. The electron charge density map indicates toward the dominance of covalent bonding in MgAl2Ge2. The optical parameters are found to be independent of the state of the polarization of incident electric field. The large value of the reflectivity in the visible-to-ultraviolet region up to ~ 15 eV suggests that MgAl2Ge2 might be a good candidate as coating material to avoid solar heating. The thermodynamic properties have been calculated using the quasi-harmonic Debye approximation. We have found indications of lattice instability at the Brillouin zone boundary in the trigonal $$P\overline{3}m1$$ P 3 ¯ m 1 phase from the phonon dispersion curves. However, the compound might be stable at elevated temperature and as a function of pressure. All the theoretical findings herein have been compared with the reported results (where available). Various implications of our results have been discussed in detail. Graphic abstract

Transparent and conducting CdO and Cr doped CdO (CdO:Cr) crystalline films were prepared on glass substrate at 350 °C by cost effective spray pyrolysis technique. Structural analysis indicates CdO:Cr films are polycrystalline cubic structure comprises with spherical or semi-spherical nano-scale particles. The direct band gap energy of CdO was found to change with Cr doping. The photoluminescence (PL) spectra of CdO show extended band edge emissions accompanied by red emission originated from different impurity states. The optical dispersion parameters calculated using Wemple–DiDomenico single-oscillator model were found to vary with Cr concentration in CdO. The dispersion energy of oscillator found to decrease with increasing Cr concentration. Simultaneously, the variation of third-order nonlinear susceptibility with photon energy was found to decrease with increasing Cr concentrations. Hall study confirms that CdO and CdO:Cr films are n-type semiconductor having carrier concentration of the order of ∼1019 cm−3. The obtained physical properties of CdO film were improved by Cr doping which make them suitable for optoelectronic applications.

Al/ZnO: Al heterojunction was fabricated by depositing ZnO: Al film on Al substrate by spray pyrolysis technique at 220 °C substrate temperature. XRD, SEM and EDAX techniques were used to study the properties of thin films. Heterojunction properties were studied by I–V and C–V measurements. The fabricated Al/ZnO: Al junctions were rectifying in character. The room temperature ideality factors of Al/ZnO: Al junctions are found to vary from 2.56 to 5.45. The reverse saturation currents are 5.21 × 10−9, 1.35 × 10−6, 1.99 × 10−6, 9.99 × 10−7 and 1.02 × 10−7 A for Al/ZnO: Al junctions. Junction forward current depends on doping concentrations and temperature, whereas reverse saturation current remains independent for Al concentration. The built-in-potential calculated from capacitance for Al/ZnO: Al junctions are 2.74, 2.60, 2.0, 2.50 and 2.43 V corresponding to 1, 2, 3, 4 and 5 mol% of Al. X-ray diffraction study confirmed that the films are polycrystalline, orientated in (0 0 2) plane. Scanning electron microscopy study confirmed circular ring patterns with inside ribbon type structure for Al doped ZnO films.

Using plane-wave pseudopotential density functional theory (DFT), the first-principle calculations are performed to investigate the structural aspects, mechanical behaviors and electronic features of the newly synthesized CaAl2Si2-prototype intermetallic compound, MgAl2Ge2 for the first time and the results are compared with those calculated for its silicide and carbide counterparts MgAl2Si2 and MgAl2C2. The calculated lattice constants agree fairly well with their corresponding experimental values. The estimated elastic tensors satisfy the mechanical stability conditions for MgAl2Ge2 along with MgAl2Si2 and MgAl2C2. The level of elastic anisotropy increases following the sequence of X-elements Ge → Si → C. MgAl2Ge2 and MgAl2Si2 are expected to be ductile and damage tolerant, while MgAl2C2 is a brittle one. MgAl2Ge2 and MgAl2Si2 should exhibit better thermal shock resistance and low thermal conductivity and accordingly these can be used as thermal barrier coating (TBC) materials. The Debye temperature of MgAl2Ge2 is lowest among three intermetallic compounds. MgAl2Ge2 and MgAl2Si2 should exhibit metallic conductivity; while the dual characters of weak-metals and semiconductors are expected for MgAl2C2. The values of theoretical Vickers hardness for MgAl2Ge2, MgAl2Si2, and MgAl2C2 are 3.3, 2.7, and 7.7 GPa, respectively, indicating that these three intermetallics are soft and easily machinable.

Heterojunction diodes of n-ZnO/p-Si (100) and n-ZnO:Al/p-Si (100) were fabricated by spray pyrolysis technique. X-ray diffraction (XRD), energy dispersive x-ray spectroscopy (EDX), and field emission scanning electron microscopy (FESEM) were used to characterize the as-prepared samples. The XRD pattern indicates the hexagonal wurzite structure of zinc oxide (ZnO) and Al-doped ZnO (AZO) thin films grown on Si (100) substrate. The compositional analysis by EDX indicates the presence of Al in the AZO structure. The FESEM image indicates the smooth and compact surface of the heterostructures. The current–voltage characteristics of the heterojunction confirm the rectifying diode behavior at different temperatures and illumination intensities. For low forward bias voltage, the ideality factors were determined to be 1.24 and 1.38 for un-doped and Al-doped heterostructures at room temperature (RT), respectively, which indicates the good diode characteristics. The capacitance–voltage response of the heterojunctions was studied for different oscillation frequencies. From the 1/C 2–V plot, the junction built-in potentials were found 0.30 V and 0.40 V for un-doped and Al-doped junctions at RT, respectively. The differences in built-in potential for different heterojunctions indicate the different interface state densities of the junctions. From the RT photoluminescence (PL) spectrum of the n-ZnO/p-Si (100) heterostructure, an intense main peak at near band edge (NBE) 378 nm (3.28 eV) and weak deep-level emissions (DLE) centered at 436 nm (2.84 eV) and 412 nm (3.00 eV) were observed. The NBE emission is attributed to the radiative recombination of the free and bound excitons and the DLE results from the radiative recombination through deep level defects.

This work illustrates thickness dependent physical properties of copper indium diselenide CuInSe 2 (CIS) thin films fabricated by a novel two stage electron-beam evaporation technique. Structural analysis exhibits CuInSe 2 phase chalcopyrite structure having preferred orientation in the (112) plane. Absorption coefficient of CIS films have been found very high and associated with band-to-band transition. The optical band gap displays a slight variation from 1.80 eV to 1.90 eV depending on film thickness. Photoluminescence (PL) study reveals the presence of acceptor-type defects in the films. Some other important optical constants, such as refractive index, real and imaginary parts of dielectric constant, optical conductivity and energy loss function are also calculated and found dependent on film thickness. Electrical conductivity measurement confirms CIS films are semiconducting in nature and the activation energy values indicate electrical transport is mainly thermally activated. Hall Effect study confirms CIS films are p-type having carrier concentration of the order of ∼10 26 m -3 .

Nanorod like crystalline CH3NH3PbI3-xClx thin film was prepared by spray pyrolysis at an ambient atmosphere. X-ray diffraction (XRD) and Raman studies reveal the tetragonal perovskite phase of spray deposited film. The optical band gap of CH3NH3PbI3-xClx is estimated to ~1.64 eV which is consistent with vacuum based deposited perovskites. The CH3NH3PbI3-xClx film exhibits a high absorption coefficient of the order of 106 m−1. Photoluminescence (PL) study suggests that band-to-band radiative recombination occurs in CH3NH3PbI3-xClx film. Cathodoluminescence study confirms the emission of 1.67 eV at 80 K and 1.80 eV at 300 K. In this study, the second harmonic generation at photon energy 3.6 eV is reported for the first time at room temperature (RT). It is noted that the band edge peak position at 1.67 eV is being diffused and shifted to 1.80 eV at RT while the second harmonic peak position at 3.6 eV remains unchanged.

Optical and photo-electrical properties of ZnO–CdO films with the ratio of Zn/Cd=1:0, 3:1, 1:1, 1:3 and 0:1 has been studied. XRD study confirms the combination of hexagonal ZnO and cubic CdO phase present in the polycrystalline sample. Atomic force microscopy results indicate that the crystal grains are agglomerated and surface roughness enhanced due to higher Cd concentration in ZnO. From optical studies, it is found that the transmittance and the band gap decreased as Cd content increased. Photoluminescence studies on ZnO–CdO films showed intense near-band edge emissions at room temperature and is attributed to recombination of excitons localized within band tail states likely caused by non-uniform Cd distribution in ZnO–CdO matrix. The dispersion of refractive index was analyzed by the Wemple–DiDomenico single-oscillator model. The third-order nonlinear polarizability is found high with higher concentration of cadmium at higher photon energies. Some other optical parameters such as dissipation factor, optical conductivity, interband transition strength, surface and volume energy loss have been calculated depending on dielectric constant evaluated from optical data. Finally, photoconductive gain and carrier lifetime have been calculated and found dependent on Zn/Cd ratio.