1. Efficient Data Management in Neutron Scattering Data Reduction Workflows at ORNL
- Author
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Steven Hahn, William F. Godoy, Jay Jay Billings, and Peter F. Peterson
- Subjects
FOS: Computer and information sciences ,Input/output ,Database ,Computer science ,business.industry ,Data management ,Experimental data ,Databases (cs.DB) ,020207 software engineering ,02 engineering and technology ,computer.file_format ,Hierarchical Data Format ,computer.software_genre ,File format ,Nexus (data format) ,Metadata ,Data access ,Computer Science - Databases ,020204 information systems ,Schema (psychology) ,0202 electrical engineering, electronic engineering, information engineering ,business ,computer ,Data reduction - Abstract
Oak Ridge National Laboratory (ORNL) experimental neutron science facilities produce 1.2\,TB a day of raw event-based data that is stored using the standard metadata-rich NeXus schema built on top of the HDF5 file format. Performance of several data reduction workflows is largely determined by the amount of time spent on the loading and processing algorithms in Mantid, an open-source data analysis framework used across several neutron sciences facilities around the world. The present work introduces new data management algorithms to address identified input output (I/O) bottlenecks on Mantid. First, we introduce an in-memory binary-tree metadata index that resemble NeXus data access patterns to provide a scalable search and extraction mechanism. Second, data encapsulation in Mantid algorithms is optimally redesigned to reduce the total compute and memory runtime footprint associated with metadata I/O reconstruction tasks. Results from this work show speed ups in wall-clock time on ORNL data reduction workflows, ranging from 11\% to 30\% depending on the complexity of the targeted instrument-specific data. Nevertheless, we highlight the need for more research to address reduction challenges as experimental data volumes increase., Comment: 7 pages, 4 figures, International Workshop on Big Data Reduction held with 2020 IEEE International Conference on Big Data
- Published
- 2020
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