1. Ptychographic imaging for the characterization of X-ray free-electron laser beams
- Author
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Tomas Ekeberg, Filipe R. N. C. Maia, N. D. Loh, Max F. Hantke, Benedikt J. Daurer, Pierre Thibault, Simone Sala, Sala, S, Daurer, Bj, Hantke, Mf, Ekeberg, T, Loh, Nd, Maia, Frnc, and Thibault, P
- Subjects
History ,Wavefronts ,Free electron lasers ,01 natural sciences ,Linear particle accelerator ,Education ,010309 optics ,Flash (photography) ,Optics ,Wavefront ,0103 physical sciences ,Light source ,X ray microscopes ,Light sources ,010306 general physics ,Physics ,business.industry ,Medicinsk bildbehandling ,Free-electron laser ,X-ray ,Computer Science Applications ,Characterization (materials science) ,Medical Image Processing ,Physics::Accelerator Physics ,business ,Free electron laser ,Beam (structure) ,Fermi Gamma-ray Space Telescope - Abstract
We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI.
- Published
- 2017