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6 results on '"Jean-Marie Mackowski"'

1. The BMV experiment : a novel apparatus to study the propagation of light in a transverse magnetic field

Author

Jacques Vigué, Benoit Pinto Da Souza, Carlo Rizzo, Laurent Pinard, Marc Nardone, Cécile Robilliard, Sebastien Batut, G. Trénec, Jean-Marie Mackowski, Christophe Michel, Oliver Portugall, Gilles Bailly, Remy Battesti, Geert L. J. A. Rikken, Laboratoire National des Champs Magnétiques Pulsés (LNCMP), Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA), Interférométrie (LCAR), Laboratoire Collisions Agrégats Réactivité (LCAR), Institut de Recherche sur les Systèmes Atomiques et Moléculaires Complexes (IRSAMC), Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Institut de Recherche sur les Systèmes Atomiques et Moléculaires Complexes (IRSAMC), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées, Laboratoire des matériaux avancés (LMA), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Systèmes Atomiques et Moléculaires Complexes (IRSAMC), Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), and Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3)

Subjects
Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], 010308 nuclear & particles physics, business.industry, FOS: Physical sciences, 01 natural sciences, Atomic and Molecular Physics, and Optics, High Energy Physics - Experiment, Finesse, High Energy Physics - Experiment (hep-ex), Optics, Transverse magnetic field, Magnet, 0103 physical sciences, Current (fluid), 010306 general physics, business, Optics (physics.optics), Physics - Optics
Abstract

In this paper, we describe in detail the BMV (Bir\'efringence Magn\'etique du Vide) experiment, a novel apparatus to study the propagation of light in a transverse magnetic field. It is based on a very high finesse Fabry-Perot cavity and on pulsed magnets specially designed for this purpose. We justify our technical choices and we present the current status and perspectives., Comment: To be published in the European Physical Journal D

Published
2008
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2. Experimental optomechanics with silicon micromirrors

Author

Lionel Rousseau, Pierre-François Cohadon, Tristan Briant, Olivier Français, Laurent Pinard, Olivier Arcizet, Jean-Marie Mackowski, Christophe Michel, Antoine Heidmann, C. Molinelli, Laboratoire Kastler Brossel (LKB (Jussieu)), Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS-PSL), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux avancés (LMA), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Electronique, Systèmes de communication et Microsystèmes (ESYCOM), Conservatoire National des Arts et Métiers [CNAM] (CNAM), HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-Université Paris-Est Marne-la-Vallée (UPEM)-ESIEE Paris, Université Pierre et Marie Curie - Paris 6 (UPMC)-Fédération de recherche du Département de physique de l'Ecole Normale Supérieure - ENS Paris (FRDPENS), École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Est Marne-la-Vallée (UPEM)-ESIEE Paris-Conservatoire National des Arts et Métiers [CNAM] (CNAM)

Subjects
Silicon, Measure (physics), General Physics and Astronomy, chemistry.chemical_element, Physics::Optics, 02 engineering and technology, Dielectric, 7. Clean energy, 01 natural sciences, Noise (electronics), Resonator, Optics, 0103 physical sciences, [SPI.MECA.MEMA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph], [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], 010306 general physics, Optomechanics, Quantum optics, Physics, business.industry, 021001 nanoscience & nanotechnology, chemistry, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Optoelectronics, 0210 nano-technology, business, Ground state
Abstract

We experimentally demonstrate the high-sensitivity optical monitoring of moving micromirrors, made of low-loss dielectric coatings upon silicon resonators of various shapes and sizes. The very high optical finesses obtained (\mathcal{F}\simeq 30\,000 ) have allowed us to measure the thermal noise of the micromirrors at room temperature with a shot-noise limited sensitivity at the 10^{-19}\,{\rm m}/\sqrt{\rm Hz} level and to completely characterize their mechanical behavior, in excellent agreement with the results of a finite-element computation. Applications of such optomechanical systems range from quantum optics experiments to the experimental demonstration of the quantum ground state of a macroscopic mechanical resonator.

Published
2008
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3. Titania-doped tantala/silica coatings for gravitational-wave detection

Author

Ian MacLaren, Steven D. Penn, Chinyere Nwabugwu, Laurent Pinard, A. E. Villar, Martin M. Fejer, Peter H. Sneddon, Gregory M. Harry, Gianpietro Cagnoli, Christophe Michel, Roger K. Route, K. L. Dooley, Andres E. Becerra-Toledo, Helena Armandula, Jean-Marie Mackowski, Matt Eichenfield, Sheila Rowan, Matthew R. Abernathy, Alban Remillieux, Eric D. Black, Colin R. How, P. G. Murray, J. H. Hough, David Crooks, P. Ganau, Stuart Reid, Laboratoire des matériaux avancés (LMA), Université Claude Bernard Lyon 1 (UCBL), and Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Physics and Astronomy (miscellaneous), Physics::Instrumentation and Detectors, FOS: Physical sciences, Physics::Optics, General Relativity and Quantum Cosmology (gr-qc), 7. Clean energy, 01 natural sciences, General Relativity and Quantum Cosmology, 04.80.Nn, 62.40.+i, 95.55.Ym, Condensed Matter::Materials Science, 0103 physical sciences, Astrophysics::Solar and Stellar Astrophysics, Sensitivity (control systems), 010306 general physics, Silica coating, Absorption (electromagnetic radiation), Physics, 010308 nuclear & particles physics, business.industry, Gravitational wave, Detector, Doping, Interferometry, Optical coating, [PHYS.GRQC]Physics [physics]/General Relativity and Quantum Cosmology [gr-qc], Optoelectronics, business, Caltech Library Services
Abstract

Reducing thermal noise from optical coatings is crucial to reaching the required sensitivity in next generation interferometric gravitational-waves detectors. Here we show that adding TiO$_2$ to Ta$_2$O$_5$ in Ta$_2$O$_5$/SiO$_2$ coatings reduces the internal friction and in addition present data confirming it reduces thermal noise. We also show that TiO$_2$-doped Ta$_2$O$_5$/SiO$_2$ coatings are close to satisfying the optical absorption requirements of second generation gravitational-wave detectors.

Published
2007
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4. Comparison of specularly-reflecting mirrors for GRANIT

Author

P. Ganau, Laurent Pinard, Valery Nesvizhevsky, Alban Remillieux, K.V. Protasov, Jean-Marie Mackowski, D. Forest, N. Morgado, J. L. Montorio, G. Quéméner, Guillaume Pignol, Christine Michel, Institut Laue-Langevin (ILL), ILL, Laboratoire de Physique Subatomique et de Cosmologie (LPSC), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Joseph Fourier - Grenoble 1 (UJF)-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux avancés (LMA), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), and GRANIT

Subjects
Nuclear and High Energy Physics, Specular reflection, Physics::Instrumentation and Detectors, Physics::Optics, Surface finish, 01 natural sciences, 7. Clean energy, Condensed Matter::Materials Science, Optics, 03.65.−w, 28.20.−v, Coatings, 0103 physical sciences, Neutron, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], 010306 general physics, Nuclear Experiment, Instrumentation, Physics::Atmospheric and Oceanic Physics, Physics, Elastic scattering, 010308 nuclear & particles physics, business.industry, Specularity, Sapphire, Ultracold neutrons, Reflection (physics), business
Abstract

The specularity of ultracold neutron reflection was compared for different “promising” surfaces, including sapphire, silica, silica with carbon (diamond-like), and copper coatings with very small roughness. The probability of total losses of ultracold neutrons (UCN) from a specular trajectory was dominated by diffusive (non-specular) elastic scattering of UCN. In all the cases considered the quality of reflection was sufficiently high for storage of UCN at specular trajectories for the first stage of GRANIT experiment.

Published
2007
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5. Rayleigh scattering, absorption, and birefringence of large-size bulk single-crystal sapphire

Author

Zewu Yan, David Blair, Kazuaki Kuroda, Slawomir Gras, Li Ju, Jean-Marie Mackowski, Chunnong Zhao, Alban Remillieux, Masao Tokunari, Laboratoire des matériaux avancés (LMA), Université Claude Bernard Lyon 1 (UCBL), and Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, Materials : Optical properties, Scattering : Scattering measurements, Materials Science (miscellaneous), and metrology : Optical inspection, 01 natural sciences, Two-photon absorption, Industrial and Manufacturing Engineering, Light scattering, 010309 optics, and metrology : Scattering measurements, symbols.namesake, Optics, Imaging systems : Image detection systems, Physical optics : Birefringence, 0103 physical sciences, Business and International Management, Rayleigh scattering, Materials : Optical materials, 010306 general physics, Absorption (electromagnetic radiation), Instrumentation, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Phonon scattering, Scattering, business.industry, and metrology : Phase measurement, X-ray Raman scattering, symbols, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], measurement, Biological small-angle scattering, business
Abstract

While the thermomechanical properties of sapphire make it an excellent candidate of test mass for advanced laser interferometers, its optical quality is not well understood or well controlled. We have studied the results from high-resolution measurements of scattering, absorption, and birefringence in test-mass samples to better understand issues of quality. Samples show large-scale scattering structures clearly linked to the crystal-growth process. Samples characterized by the presence of point defects have significantly lower scattering (except at the point defects). In general on a large scale, high scattering also correlates with higher absorption and higher average birefringence inhomogeneity. However, on a smaller scale there is not a clear point-to-point correlation between scattering and absorption. Often a large-scale scattering structure is spatially displaced by tens of millimeters from a similar absorption structure, indicating that quite separate microscopic mechanisms give rise to scattering and absorption. The spatial displacements indicate that absorption centers and scattering centers are laid down during crystal growth at different distances from the solid-liquid interface. We suggest that absorption may be linked to F centers, while scattering may be linked to impurities such as iron.

Published
2006

6. Original optical metrologies of large components

Author

B. Lagrange, Renée Pignard, Bernard Cimma, Alban Remillieux, J.-L. Montorio, P. Ganau, N. Morgado, Christophe Michel, Laurent Pinard, Danielle Forest, Jean-Marie Mackowski, Girod, Dominique, Laboratoire des matériaux avancés (LMA), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), and VIRGO

Subjects
Materials science, Optical metrology, stitching interferometry, Surface finish, [SDU.ASTR] Sciences of the Universe [physics]/Astrophysics [astro-ph], 01 natural sciences, 010309 optics, Image stitching, [PHYS.ASTR.CO]Physics [physics]/Astrophysics [astro-ph]/Cosmology and Extra-Galactic Astrophysics [astro-ph.CO], Optics, 0103 physical sciences, Astronomical interferometer, Calibration, 010306 general physics, roughness, [SDU.ASTR]Sciences of the Universe [physics]/Astrophysics [astro-ph], birefringence, business.industry, scattering, Metrology, Interferometry, [PHYS.ASTR.CO] Physics [physics]/Astrophysics [astro-ph]/Cosmology and Extra-Galactic Astrophysics [astro-ph.CO], Profilometer, Spatial frequency, business, absorption
Abstract

présentée par A. Remillieux; The coating deposition on large optical components (diameter 350 mm) has required the development of new metrology tools at 1064 nm. To give realistic values of the optical performances, the whole surface of the component needs to be scanned. Our scatterometer (commercial system) has been upgraded to support large and heavy samples. The other metrology tools are prototypes we have developed. We can mention the absorption (photothermal effect) and birefringence bench, a control interferometer equipped with an original stitching option, the optical profilometer (RMS roughness and small defect measurements). A detailed description of these metrology benches will be exposed. Their sensitivity, accuracy and capability to map the optical properties of substrates or mirrors will be discussed. We will describe the recent developments: the stitching option adapted to the Micromap profilometer to measure the RMS roughness on larger area (exploration of a new spatial frequency domain), the accurate bulk absorption calibration.

Published
2004

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