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Your search keyword '"Mascio, S."' showing total 2 results
Start Over Author "Mascio, S." Topic 0103 physical sciences
2 results on '"Mascio, S."'

1. A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

Author

Alessandra Menicucci, Gianluca Furano, Marco Ottavi, Andrea Fabbri, Francesco Di Capua, L. Campajola, Stefano Di Mascio, Tomasz Szewczyk, DI CAPUA, Francesco, Furano, G. A, Di Mascio, S. B, Szewczyk, T. A, Menicucci, A. C, Campajola, Luigi, Fabbri, A. E, Ottavi, M. B., IEEE, Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., Fabbri, A., and Ottavi, M.

Subjects
Engineering, Proton, 0102 computer and information sciences, 01 natural sciences, Settore ING-INF/01 - Elettronica, Set (abstract data type), Printed circuit board, System in package, VLSI circuits Hybrid component, Low energy, 0103 physical sciences, Electronic engineering, Nanotechnology, Electronics, Radiation test, Programmable logic controller, 010308 nuclear & particles physics, business.industry, Fault tolerance, Microcontroller, Engineering controlled terms: Defect, Aerospace electronics, 010201 computation theory & mathematics, Low-energy proton, Real estate Engineering main heading: System-on-chip, business, System-in-package
Abstract

This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.

Published
2016

2. Full characterization of a compact 90 Sr/ 90 Y beta source for TID radiation testing

Author

S. Di Mascio, Alberto Aloisio, Alessandra Menicucci, Pierluigi Casolaro, L. Campajola, Gianluca Furano, Marco Ottavi, M. Campajola, F. Di Capua, A. Lucaroni, Fabio Malatesta, Di Capua, F., Campajola, L., Casolaro, P., Campajola, M., Aloisio, A., Lucaroni, A., Furano, G., Menicucci, A., Di Mascio, S., Malatesta, F., and Ottavi, M.

Subjects
Atmospheric Science, 90 Sr/ 90 Y beta source, 010504 meteorology & atmospheric sciences, COTS, Settore ING-INF/01, Radiation hardness assurance, Aerospace Engineering, Radiation, Total Ionizing Dose, 01 natural sciences, Settore ING-INF/01 - Elettronica, Linear particle accelerator, Optics, 0103 physical sciences, Beta particle, Dosimetry, Beta (velocity), Irradiation, 010303 astronomy & astrophysics, 0105 earth and related environmental sciences, Physics, business.industry, Gamma ray, Astronomy and Astrophysics, Geophysics, Space and Planetary Science, Absorbed dose, General Earth and Planetary Sciences, business
Abstract

A new methodology for Total Ionizing Dose (TID) tests is proposed. It is based on the employment of an on-chip 90Sr/90Y beta source as alternative to standard methods such as 60Co gamma rays and electrons from LINAC. The use of a compact beta source for TID tests has several advantages. In particular, the irradiation of devices with more than one radiation source results in a better representation of the complex space radiation environment composed of several types, energies and dose-rates. In addition, the use of an easy handling beta source allows the irradiation of electronic devices without any damage to other auxiliary circuit. In this work, 90Sr/90Y beta source dosimetry and related radiation field characteristics are discussed in depth. In order to validate the proposed source for TID tests, a rather complex device such as the “SPC56EL70L5” microcontroller from ST-Microelectronics was exposed to 90Sr/90Y beta rays. The results of this test were compared to that of a previous test of another sample from the same lot with a standard gamma 60Co source. The electronic performances following the two irradiations have been found to be in excellent agreement, by demonstrating therefore the validity of the proposed beta source for TID tests.

Published
2019

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