1. Use of interface phonon-polaritons for the alloy determination in ZnO/(Zn,Mg)O multiple quantum wells
- Author
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E. Martínez Castellano, Adrian Hierro, Miguel Montes Bajo, Julen Tamayo-Arriola, Denis Lefebvre, Maxime Hugues, N. Le Biavan, J. M. Chauveau, Centre de recherche sur l'hétéroepitaxie et ses applications (CRHEA), Université Nice Sophia Antipolis (... - 2019) (UNS), and COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-Centre National de la Recherche Scientifique (CNRS)-Université Côte d'Azur (UCA)
- Subjects
Composition-dependent phonon frequency ,Materials science ,Phonon ,Reflectance spectroscopy ,Multiple quantum ,Alloy ,Analytical chemistry ,General Physics and Astronomy ,Cathodoluminescence ,02 engineering and technology ,engineering.material ,01 natural sciences ,Spectral line ,0103 physical sciences ,Calibration ,Polariton ,Interface phonon polariton ,ComputingMilieux_MISCELLANEOUS ,010302 applied physics ,[PHYS]Physics [physics] ,Surfaces and Interfaces ,General Chemistry ,Alloy determination ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,ZnO ,Quantum wells ,Surfaces, Coatings and Films ,engineering ,Longitudinal optical ,0210 nano-technology - Abstract
A method based on infrared reflectance spectroscopy is presented by which the Mg content in ZnO/(Zn,Mg)O multiple quantum wells with very thin barriers can be determined. The method relies on the observation of interface phonon-polaritons which appear as sharp dips in the p-polarized reflectance spectra at oblique incidence near the longitudinal optical (LO)-phonon frequencies of both QW and barrier materials. By fitting the reflectance spectra to a dielectric function model, the LO phonon frequency of the (Zn,Mg)O barrier layers can be determined. The LO phonon frequency depends on the Mg content. Comparing to Mg content calibration via cathodoluminescence, a linear relationship between the reflectance dip frequency and the Mg content is obtained. The presented method serves as a rapid means to determine the Mg content on final structures with very thin (Zn,Mg)O layers-such as device structures-where alternative, destructive methods cannot be used., Applied Surface Science, 567, ISSN:0169-4332, ISSN:1873-5584
- Published
- 2021
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