1. InAs/GaAs quantum dot lasers with GaP strain-compensation layers grown by molecular beam epitaxy
- Author
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Quoc Huy Vo, Takeo Kageyama, Katsuyuki Watanabe, Yasuhiko Arakawa, Mitsuru Sugawara, Keizo Takemasa, and Satoshi Iwamoto
- Subjects
Materials science ,Signal modulation ,02 engineering and technology ,01 natural sciences ,law.invention ,Semiconductor laser theory ,020210 optoelectronics & photonics ,law ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,Materials Chemistry ,Electrical and Electronic Engineering ,Diode ,010302 applied physics ,business.industry ,Surfaces and Interfaces ,Condensed Matter Physics ,Laser ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Active layer ,Quantum dot laser ,Quantum dot ,Optoelectronics ,business ,Molecular beam epitaxy - Abstract
The strain-compensation (SC) technique to reduce the accumulation of strain is a promising approach to increase the design flexibility as well as the performance of quantum dot (QD) lasers. Here we have studied the application of tensile-strained ultra-thin GaP layers into multiple stacked InAs/GaAs QD grown by MBE. XRD analysis shows the controllability of the average strain in multiple-stacked QD active layer, revealing a reduction in accumulated strain. Fabricated QD laser diodes including thinner QD active layers realized by SC technology show a narrower vertical far-field angle and an increased small signal modulation bandwidth without loss of gain. Cross-sectional SEM image of SC-QD LD active region
- Published
- 2016