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Your search keyword '"Joulaud, Cécile"' showing total 4 results
Start Over Author "Joulaud, Cécile" Topic [phys.meca.geme]physics [physics]/mechanics [physics]/mechanical engineering [physics.class-ph]
4 results on '"Joulaud, Cécile"'

1. Growth and formation dynamics of acentric dielectric nanoparticles in reverse microemulsions probed by Hyper-Rayleigh Scattering measurements

Author

El Kass, Moustafa, Joulaud, Cécile, Houf, Latifa, Mugnier, Yannick, Le Dantec, Ronan, Hadj, Rachid, Vincent, B., Djanta-Nadjombe, G., Rouxel, Didier, Fontvieille, D., Galez, Christine, Symme, Univ. Savoie Mont Blanc, Laboratoire SYstèmes et Matériaux pour la MEcatronique (SYMME), and Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])

Subjects
[PHYS.MECA.GEME] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [PHYS.MECA.GEME]Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [SPI.MECA.GEME] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph], ComputingMilieux_MISCELLANEOUS, [SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]
Abstract

International audience

Published
2011

2. Hyper Rayleigh Scattering: a means for investigating the growth mechanism of nanocrystals with quadratic optical properties in reverse micellar solution route synthesis

Author

El Kass, Moustafa, Houf, Latifa, Joulaud, Cécile, Le Dantec, Ronan, Mugnier, Yannick, Galez, Christine, Fontvieille, Dominique, Viboud, Sylvie, Hadji, Rachid, Vincent, Brice, Rouxel, Didier, Symme, Univ. Savoie Mont Blanc, Laboratoire SYstèmes et Matériaux pour la MEcatronique (SYMME), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry]), Centre Alpin de Recherche sur les Réseaux Trophiques et Ecosystèmes Limniques (CARRTEL), Institut National de la Recherche Agronomique (INRA)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry]), Institut Jean Lamour (IJL), Institut de Chimie du CNRS (INC)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National de la Recherche Agronomique (INRA), and Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS.MECA.GEME] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [PHYS.MECA.GEME]Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [SPI.MECA.GEME] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph], ComputingMilieux_MISCELLANEOUS, [SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]
Abstract

International audience

Published
2010

3. Non linear optical properties of noncentrosymmetric nanocrystals from ensemble measurements (Hyper-Rayleigh Scattering) and individual inspection (SHG microscopy)

Author

Mugnier, Yannick, Le Dantec, Ronan, Clark, Gareth, Joulaud, Cécile, Djanta, Gnon, Badie, Laurent, Galez, Christine, Extermann, Jérôme, Bonacina, Luigi, Kasparian, Christelle, Wolf, Jean-Pierre, Symme, Univ. Savoie Mont Blanc, Laboratoire SYstèmes et Matériaux pour la MEcatronique (SYMME), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry]), Institute of Atomic Physics, Université de Roumanie, Group of Applied Physics [Geneva] (GAP), and University of Geneva [Switzerland]

Subjects
[PHYS.MECA.GEME] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [PHYS.MECA.GEME]Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [SPI.MECA.GEME] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph], ComputingMilieux_MISCELLANEOUS, [SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]
Abstract

International audience

Published
2010

4. Second harmonic imaging probes for bio-labeling

Author

Joulaud, Cécile, Le Dantec, Ronan, Mugnier, Yannick, Galez, Christine, Bonacina, Luigi, Extermann, Jérôme, Kasparian, Christelle, Wolf, Jean-Pierre, Symme, Univ. Savoie Mont Blanc, Laboratoire SYstèmes et Matériaux pour la MEcatronique (SYMME), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry]), Institute of Atomic Physics, Université de Roumanie, Group of Applied Physics [Geneva] (GAP), and University of Geneva [Switzerland]

Subjects
[PHYS.MECA.GEME] Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [PHYS.MECA.GEME]Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [SPI.MECA.GEME] Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph], [SPI.MECA.GEME]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanical engineering [physics.class-ph]
Published
2010

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