118 results on '"Menyhard, M"'
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2. Scratching resistance of SiC-rich nano-coatings produced by noble gas ion mixing
3. Novel method for the production of SiC micro and nanopatterns
4. Optical properties and excitation energies of iridium derived from reflection electron energy loss spectroscopy spectra
5. Wafer-scale SiC rich nano-coating layer by Ar+ and Xe+ ion mixing
6. Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling
7. Texture change of TiN films due to anisotropic incorporation of oxygen
8. Structural, mechanical and biological comparison of TiC and TiCN nanocomposites films
9. Passivation of GaAs(001) surface by the growth of high quality c-GaN ultra-thin film using low power glow discharge nitrogen plasma source
10. In-depth distribution of ion beam damage in SiC
11. The inelastic mean free path of electrons. Past and present research
12. Determination of relative sputtering yield of Cr/Si
13. Stability of ZnO{0 0 0 1} against low energy ion bombardment
14. Unexpectedly high sputtering yield of carbon at grazing angle off incidence ion bombardment
15. Determination of the surface excitation correction in elastic peak electron spectroscopy for selected conducting polymers
16. Electron stimulated thorium adatom enrichment on the surface of thoriated tungsten below 2300 K
17. Surface excitation correction of the inelastic mean free path in selected conducting polymers
18. Determination of the thickness and density of the ion bombardment induced altered layer in SiC by means of reflection electron energy loss study
19. Ion bombardment induced interface broadening in Co/Cu system as a function of layer thickness
20. What is the real driving force of bilayer ion beam mixing?
21. Cooperative mixing induced surface roughening in bilayer metals: a possible novel surface damage mechanism
22. Hydrogen and surface excitation in electron spectra of polyethylene
23. Does the thermal spike affect low energy ion-induced interfacial mixing?
24. Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III–V semiconductors
25. Determination of effective electron inelastic mean free paths in SiO 2 and Si 3N 4 using a Si reference
26. Recoil effect in carbon structures and polymers
27. Interdiffusion in amorphous Si/Ge multilayers by Auger depth profiling technique
28. Surface excitation effects in electron spectroscopy
29. Structural effects in the growth of giant magnetoresistance (GMR) spin valves
30. Recoil broadening of the elastic peak in electron spectroscopy
31. Demixing in spin valve structures: an Auger depth profiling study
32. High-depth-resolution Auger depth profiling/atomic mixing
33. TEM sample preparation by ion milling/amorphization
34. Experimental determination of the inelastic mean free path of electrons in GaSb and InSb
35. Determination of the transmission and correction of electron spectrometers, based on backscattering and elastic reflection of electrons
36. Asymmetric transient enhanced intermixing in Pt/Ti
37. Influence of layer microstructure in the double nucleation process in Cu/Mg multilayers
38. Detection of nanoparticles by means of reflection electron energy loss spectroscopy depth profiling.
39. Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu and Ag at 0.5 and 1 keV energies.
40. Sputtering of SiC with low energy He and Ar ions under grazing incidence.
41. Interface broadening due to Ar+ ion bombardment measured on Co/Cu multilayer at grazing angle of incidence.
42. Relative sputter rate measured in Cu/Co multilayer using Ar+ ion bombardment at grazing angle of incidence.
43. Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter.
44. Experimental estimation of surface excitation parameter for surface analysis.
45. Determination of inelastic mean free paths for AuPd alloys by elastic peak electron spectroscopy (EPES).
46. Intercomparison of methods for separation of REELS elastic peak intensities for determination of IMFP.
47. Experimental determination of the inelastic mean free path of electrons in GaP and InAs.
48. On the performance of the TRIM simulation for the evaluation of auger depth profiles.
49. Determination of the Ion Sputtering-induced In-depth Distribution by Means of Elastic Peak Electron Spectroscopy.
50. Study of Low-energy Atomic Mixing by Means of Auger Depth Profiling, XTEM and TRIM Simulation on Ge/Si Multilayer System.
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