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Thin film Cu(In,Ga)Se2 (CIGS) solar modules can be grown on flexible and lightweight substrates allowing their direct integration into building elements. Such multifunctional building elements would significantly reduce the installation cost of photovoltaic systems provided that CIGS solar cells with high conversion efficiency can be obtained. Also, there is a need for low cost substrate foil. Mild steel is a promising low cost substrate material due to its excellent mechanical stability and already wide acceptance as component in building envelopes and in numerous other applications. During the growth of the CIGS absorber layer certain elements, e.g. iron, can diffuse from the metallic substrate into the semiconductor deteriorating the device performance. Here we present an effective diffusion barrier and device architecture for processing of highly efficient CIGS solar cells on mild steel substrates. The CIGS absorber layers were grown on mild steel foils by a multistage co-evaporation process at different substrate temperatures. The mild steel substrates were plated with an industrially scalable electrodeposited Ni/Cr bi-layer. The diffusion barrier layer properties of this Ni/Cr coating were investigated directly by measuring the metallic impurities within the absorber by secondary ion mass spectrometry and indirectly by admittance spectroscopy. The Ni/Cr bi-layer was found to be effective up to a nominal CIGS growth temperature of 500 °C. A certified cell efficiency of 18.0% was achieved on a Ni/Cr coated mild steel substrate using a low temperature CIGS deposition process and a NaF and RbF post deposition treatment method.

Improving the quantum coherence of solid-state systems that mimic two-level atoms, for instance spin qubits or single-photon emitters using semiconductor quantum dots, involves dealing with the noise inherent to the device. Charge noise results in a fluctuating electric field, spin noise in a fluctuating magnetic field at the location of the qubit, and both can lead to dephasing and decoherence of optical and spin states. We investigate noise in an ultrapure semiconductor device using a minimally invasive, ultrasensitive local probe: resonance fluorescence from a single quantum dot. We distinguish between charge noise and spin noise through a crucial difference in their optical signatures. Noise spectra for both electric and magnetic fields are derived from 0.1 Hz to 100 kHz. The charge noise dominates at low frequencies, spin noise at high frequencies. The noise falls rapidly with increasing frequency, allowing us to demonstrate transform-limited quantum-dot optical linewidths by operating the device above 50 kHz. Charge noise and spin noise lead to decoherence of the state of a quantum dot. A fast spectroscopic technique based on resonance fluorescence can distinguish between these two deleterious effects, enabling a better understanding of how to minimize their influence.