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We recently demonstrated the lowest bandgap bulk ferroelectric, BaTi1−x(Mn1/2Nb1/2)xO3, a promising candidate material for visible light absorption in optoelectronic devices. Using a combination of x-ray spectroscopies and density functional theory (DFT) calculations, we here elucidate this compound's electronic structure and the modifications induced by Mn doping. In particular, we are able to rationalize how this compound retains its ferroelectricity even through a significant reduction of the optical gap upon Mn doping. The local electronic structure and atomic coordination are investigated using x-ray absorption at the Ti K, Mn K, and O K edges, which suggests only small distortions to the parent tetragonal ferroelectric system, BaTiO3, thereby providing a clue to the substantial retention of ferroelectricity in spite of doping. Features at the Ti K edge, which are sensitive to local symmetry and an indication of Ti off-centering within the Ti-O6 octahedra, show modest changes with doping and strongly corroborates our measured polarization values. Resonant photoelectron spectroscopy results suggest the origin of the reduction of the bandgap in terms of newly created Mn d bands that hybridize with O 2p states. X-ray absorption spectra at the O K edge provide evidence for new states below the conduction band of the parent compound, illustrating additional contributions facilitating bandgap reduction. [ABSTRACT FROM AUTHOR]

The microstructures of amorphous and polycrystalline ferroelectric Hf0.5Zr0.5O2 films are studied by X-ray spectroscopy and ellipsometry. EXAFS spectra demonstrate that the amorphous film consists of an “incompletely mixed” solid solution of metallic oxides HfO2 and ZrO2. After rapid thermal annealing, the mixed Hf0.5Zr0.5O2 oxide films have a more ordered polycrystalline structure, and individual Hf and Zr monoxide islands are formed in the films. These islands are several nanometers in size and have a structure that is similar to the monoclinic structure of HfO2 and ZrO2. The presence of the HfO2 and ZrO2 phases in the Hf0.5Zr0.5O2 films is also detected by ellipsometry. [ABSTRACT FROM AUTHOR]

New germanides with composition RE3Pt4Ge13 (RE = Y, Pr, Sm, Gd, Tb, Tm) have been prepared by high-pressure, high-temperature synthesis. Their crystal structures have been refined, and the relationship of this new rhombohedral and monoclinic structure types with the primitive cubic Yb3Rh4Sn13 prototype is discussed. Band structure calculations within density functional theory confirm the distorted rhombohedral and monoclinic structural arrangements to be energetically more favorable than the simple cubic one. X-ray absorption spectroscopy and magnetic susceptibility measurements indicate that the RE-atoms are in the +3 oxidation state in all studied compounds. [ABSTRACT FROM AUTHOR]

We report here the first direct observation of U(V) in uranium binary oxides and analyze the gradual conversion of the U oxidation state in the mixed uranium systems. Our finding clarifies previous contradicting results and provides important input for the geological disposal of spent fuel, recycling applications, and chemistry of uranium species. [ABSTRACT FROM AUTHOR]

Cu Kβ2,5 X-ray emission and resonant inelastic X-ray scattering measurements were performed on monovalent and divalent copper compounds. The data were compared with the results of local-density-approximation calculations. The methods were found to be efficient tools for studies of Cu 4p states in the valence band and for distinguishing between different monovalent copper compounds. This is of particular importance for the debate concerning copper corrosion in oxygen-free water. [ABSTRACT FROM AUTHOR]

The size and lattice constant evolution of Pb nanoparticles (NPs) synthesized by high fluence implantation in crystalline Si have been studied with a variety of experimental techniques. Results obtained from small-angle x-ray scattering showed that the Pb NPs grow with increasing implantation fluence and annealing duration. The theory of NP growth kinetics can be applied to qualitatively explain the size evolution of the Pb NPs during the implantation and annealing processes. Moreover, the lattice constant of the Pb NPs was evaluated by conventional x-ray diffraction. The lattice dilatation was observed to decrease with increasing size of the Pb NPs. Such lattice constant tuning can be attributed to the pseudomorphism caused by the lattice mismatch between the Pb NPs and the Si matrix. [ABSTRACT FROM AUTHOR]

The article describes the structure of the Ce L3 x-ray absorption spectra (XAS) of CeFe2. The single impurity Anderson model (SIAM) and the first-principles band calculations based on the density-functional theory (DFT) were utilized to describe the structure. It was discovered that the mixed valence 4f character revealed by the core-hole potential effect influence the structure of Ce L3 XAS.

Original article: EPL, 124 (2018) 27005. [ABSTRACT FROM AUTHOR]

We present resonant x-ray emission spectroscopic data from the uranium intermetallics UPd3, USb, USn3, and URu2Si2 at the M4,5 edges of uranium, and we compare the data to those from the well-localized 5f² semiconductor UO2. The technique is especially sensitive to any oxidation of the surface, and this was found on the USb sample, thus preventing a good comparison with a material known to be 5f³. We have found a small energy shift between UO2 and UPd3, both known to have localized 5f² configurations, which we ascribe to the effect of conduction electrons in UPd3. The spectra from UPd3 and URu2Si2 are similar, strongly suggesting a predominant 5f² configuration for URu2Si2. The valence-band resonant inelastic x-ray scattering provides information on the U P3 transitions (at about 18 eV) between the U 5f and U 6p states, as well as transitions of between 3 and 7 eV from the valence band into the unoccupied 5f states. These transitions are primarily involving mixed ligand states (O 2p or Pd,Ru 4d) and U 5f states. Calculations are able to reproduce both of these low-energy transitions reasonably well. [ABSTRACT FROM AUTHOR]

The microstructures of amorphous and polycrystalline ferroelectric Hf0.5Zr0.5O2 films are studied by X-ray spectroscopy and ellipsometry. EXAFS spectra demonstrate that the amorphous film consists of an “incompletely mixed” solid solution of metallic oxides HfO2 and ZrO2. After rapid thermal annealing, the mixed Hf0.5Zr0.5O2 oxide films have a more ordered polycrystalline structure, and individual Hf and Zr monoxide islands are formed in the films. These islands are several nanometers in size and have a structure that is similar to the monoclinic structure of HfO2 and ZrO2. The presence of the HfO2 and ZrO2 phases in the Hf0.5Zr0.5O2 films is also detected by ellipsometry. [ABSTRACT FROM AUTHOR]