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12. Influence of Li Ions on Memristor Properties of Capacitor Structures Based on Nanocomposites (Co40Fe40B20)x(LiNbO3)100–x.

Author

Sitnikov, A. V., Kalinin, Yu. E., Babkina, I. V., Nikonov, A. E., Kopytin, M. N., Yanchenko, L. I., and Shakurov, A. R.

Subjects
*COPPER, *BUFFER layers, *ELECTRODIFFUSION, *DIELECTRICS, *VOLTAGE
Abstract

The paper reveals the influence of Li, B and the composition of metal contacts on the processes of resistive switching in memristive structures M/NC/D/M. After field exposure in structures Cu/(Co50Fe50)x(LiNbO3)100–x/s-LiNbO3/Cu/sitall, Cu/(Co50Fe50)x(LiNbO3)100–x/d-LiNbO3/Cu/sitall and Cu/(Co40Fe40B20)x(SiO2)100–x/d LiNbO3/Cu/sitall at x < 13 was detected a residual voltage (up to 16 mV) due to the electromigration of Li ions, that leading to a "reversible" type of VAC hysteresis and instability of the time dependencies of induced resistive states. In the structures of Cu/(Co40Fe40B20)x(LiNbO3)100–x/s-LiNbO3/Cu/sitall, Cr/Cu/Cr/(Co40Fe40B20)x(LiNbO3)100–x/s-LiNbO3/Cr/Cu/Cr/sitall containing B, the residual voltage is reduced by formation of chemical compounds B with percolated Li atoms. When limiting the electromigration of Li ions, the main mechanism of resistive switching is the processes of electromigration of oxygen vacancies in the dielectric oxide layer. Suppression of residual voltage in the Cr/Cu/Cr/(Co50Fe50)x(LiNbO3)100–x/s-LiNbO3/Cr/Cu/Cr/sitall structure due to the introduction of a Cr buffer layer that does not dissolve Li leads to the absence of bipolar resistive switching in these structures. [ABSTRACT FROM AUTHOR]

Published
2024
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13. Influence of Li Ions on Memristor Properties of Capacitor Structures Based on Nanocomposites (Co40Fe40B20)x(LiNbO3)100–x.

Author

Sitnikov, A. V., Kalinin, Yu. E., Babkina, I. V., Nikonov, A. E., Kopytin, M. N., Yanchenko, L. I., and Shakurov, A. R.

Subjects
COPPER, BUFFER layers, ELECTRODIFFUSION, DIELECTRICS, VOLTAGE
Abstract

The paper reveals the influence of Li, B and the composition of metal contacts on the processes of resistive switching in memristive structures M/NC/D/M. After field exposure in structures Cu/(Co50Fe50)x(LiNbO3)100–x/s-LiNbO3/Cu/sitall, Cu/(Co50Fe50)x(LiNbO3)100–x/d-LiNbO3/Cu/sitall and Cu/(Co40Fe40B20)x(SiO2)100–x/d LiNbO3/Cu/sitall at x < 13 was detected a residual voltage (up to 16 mV) due to the electromigration of Li ions, that leading to a "reversible" type of VAC hysteresis and instability of the time dependencies of induced resistive states. In the structures of Cu/(Co40Fe40B20)x(LiNbO3)100–x/s-LiNbO3/Cu/sitall, Cr/Cu/Cr/(Co40Fe40B20)x(LiNbO3)100–x/s-LiNbO3/Cr/Cu/Cr/sitall containing B, the residual voltage is reduced by formation of chemical compounds B with percolated Li atoms. When limiting the electromigration of Li ions, the main mechanism of resistive switching is the processes of electromigration of oxygen vacancies in the dielectric oxide layer. Suppression of residual voltage in the Cr/Cu/Cr/(Co50Fe50)x(LiNbO3)100–x/s-LiNbO3/Cr/Cu/Cr/sitall structure due to the introduction of a Cr buffer layer that does not dissolve Li leads to the absence of bipolar resistive switching in these structures. [ABSTRACT FROM AUTHOR]

Published
2024
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22. Formation of (Co40Fe40B20)x(LiNbO3)100 –xComposite Film on a Metallic Substrate.

Author

Sitnikov, A. V., Babkina, I. V., Kalinin, Yu. E., Nikonov, A. E., Kopytin, M. N., Shakurov, A. R., Remizova, O. I., and Yanchenko, L. I.

Subjects
METALLIC films, SUBSTRATES (Materials science), COPPER, METALLIC surfaces, NANOCOMPOSITE materials
Abstract

The topological features of the formation of (Co40Fe40B20)15(LiNbO3)85 composite films deposited by ion-beam method on a metal electrode Cr/Cu/Cr has been investigated. The presence of a dielectric layer between the upper Cr layer and the CoFe–LiNbO3 film with a thickness of dox ≈ 15 nm has been established. The difference in the size of granules near the amorphous layer and in the volume of the film has been shown. A model of the formation of (Co40Fe40B20)x (LiNbO3)100 –x nanocomposite film at the initial stage of growth has been proposed. It has been shown that the formation of α-LiNbO3 layer on the chrome metal film surface is possible with the realization of island and layer-by-layer growth mechanisms for various phases of the composite. [ABSTRACT FROM AUTHOR]

Published
2024
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26. Electrical and Optical Properties of Cobalt Oxide Thin Films, Prepared by Ion-Beam Sputtering.

Author

Gabriel's, K. S., Kalinin, Yu. E., Makagonov, V. A., Pankov, S. Yu., and Sitnikov, A. V.

Subjects
*OXIDE coating, *THIN films, *COBALT oxides, *OPTICAL properties, *ELECTRIC conductivity, *COBALT compounds, *COBALT
Abstract

Optical and electrical properties of cobalt oxide thin films obtained by ion-beam sputtering in argon atmosphere and argon with the addition of oxygen (PAr = 1.1 × 10–5 Torr) has been investigated in the work. Optical properties investigations showed that, for films of cobalt oxide obtained in argon atmosphere, the optical band gap is independent of the film thickness and is 3.24 eV, which is in the range of given in the literature for the CoO phase values. For cobalt oxide films obtained in mixed atmosphere of argon with the addition of oxygen, two direct optical transitions with energies of 1.45 and 2.1 eV were detected. The presence of two direct allowed optical transitions is associated with the variable valence of cobalt in the Co3O4 compound and the presence of two valence states Co2+ and Co3+. The dependences of specific electrical conductivity of the synthesized films on the magnitude of the electric field were studied. It was found that for all investigated samples, the electrical conductivity does not depend on the electric field strength up to the value of E = 106 V/m. The nonlinearity of the dependence of specific electrical conductivity of the synthesized films on electric field strength at E > 106 V/m is discussed in terms of the hopping conductivity model and the trap ionization model described by the Poole–Frenkel effect. [ABSTRACT FROM AUTHOR]

Published
2023
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49. Structure and FMR Characteristics of (CoFeB + SiO2) Magnetic Composite Films.

Author

Kotov, L. N., Ustyugov, V. A., Vlasov, V. S., Utkin, A. A., Kalinin, Yu. E., and Sitnikov, A. V.

Abstract

It is found that (CoFeB + SiO2) composite films have a narrow spread of film surface protrusions at low concentrations of the metal alloy (x < 0.35), while a wider spread and smooth distribution of the protrusions are observed at the large concentration (x > 0.53). It is shown that the concentration dependence of the ferromagnetic resonance linewidth has a maximum at x = 0.45, due to the percolation structure of the films. [ABSTRACT FROM AUTHOR]

Published
2023
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