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1. Calibration methods for charge integrating detectors

Author

Mezza, D., Becker, J., Carraresi, L., Castoldi, A., Dinapoli, R., Goettlicher, P., Graafsma, H., Greiffenberg, D., Hirsemann, H., Klujev, A., Kuhn, M., Lange, S., Laurus, T., Maffessanti, S., Marras, A., Mozzanica, A., Poehlsen, J., Redford, S., Ruder, C., Schmitt, B., Sheviakov, I., Shi, X., Trunk, U., Vetter, S., Zhang, J., and Zimmer, M.

Published
2022
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3. Characterization of AGIPD1.0: The full scale chip

Author

Mezza, D., Allahgholi, A., Arino-Estrada, G., Bianco, L., Delfs, A., Dinapoli, R., Goettlicher, P., Graafsma, H., Greiffenberg, D., Hirsemann, H., Jack, S., Klanner, R., Klyuev, A., Krueger, H., Marras, A., Mozzanica, A., Poehlsen, J., Schmitt, B., Schwandt, J., Sheviakov, I., Shi, X., Trunk, U., Xia, Q., Zhang, J., and Zimmer, M.

Published
2016
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6. The Medipix2-based network for measurement of spectral characteristics and composition of radiation in ATLAS detector

Author

Vykydal, Z., Bouchami, J., Campbell, M., Dolezal, Z., Fiederle, M., Greiffenberg, D., Gutierrez, A., Heijne, E., Holy, T., Idarraga, J., Jakubek, J., Kral, V., Kralik, M., Lebel, C., Leroy, C., Llopart, X., Maneuski, D., Nessi, M., O’Shea, V., Platkevic, M., Pospisil, S., Suk, M., Tlustos, L., Vichoudis, P., Visschers, J., Wilhelm, I., and Zemlicka, J.

Published
2009
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9. Growth of thick films CdTe from the vapor phase

Author

Greiffenberg, D., Sorgenfrei, R., Bachem, K.H., and Fiederle, M.

Subjects
Crystallography -- Analysis, Thick films -- Analysis, Business, Electronics, Electronics and electrical industries
Abstract

100 [micro]m thick films of CdTe were grown on semi-insulating (100) GaAs substrates by Physical Vapor Transport (PVT) in a modified Molecular Beam Epitaxy facility. The grown layers were highly oriented as revealed from X-ray pole figure measurements. Temperature- and intensity-dependent photoluminescence measurements were taken before and after the chemical removal of the substrate to determine the effect of the GaAs substrate and to estimate the crystallographic quality of the layers. Current-voltage characteristics were performed to obtain the resistitivity of the layers with [10.sup.8] [OMEGA]cm. Index Terms--CdTe, MBE, photoluminescence, radiation detector, thick films, x-ray diffraction.

Published
2007

12. The JUNGFRAU Detector for Applications at Synchrotron Light Sources and XFELs.

Author

Mozzanica, A., Andrä, M., Barten, R., Bergamaschi, A., Chiriotti, S., Brückner, M., Dinapoli, R., Fröjdh, E., Greiffenberg, D., Leonarski, F., Lopez-Cuenca, C., Mezza, D., Redford, S., Ruder, C., Schmitt, B., Shi, X., Thattil, D., Tinti, G., Vetter, S., and Zhang, J.

Subjects
DETECTORS, INTEGRATED circuits, PHOTONS, PHOTON counting, PREAMPLIFIERS
Published
2018
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14. The EIGER detector for low-energy electron microscopy and photoemission electron microscopy.

Author

Tinti, G., Marchetto, H., Vaz, C. A. F., Kleibert, A., Andrä, M., Barten, R., Bergamaschi, A., Brückner, M., Cartier, S., Dinapoli, R., Franz, T., Fröjdh, E., Greiffenberg, D., Lopez-Cuenca, C., Mezza, D., Mozzanica, A., Nolting, F., Ramilli, M., Redford, S., and Ruat, M.

Subjects
DETECTORS, ELECTRON microscopy, PHOTOELECTRON spectroscopy, NANOPARTICLES, RADIATION damage
Abstract

EIGER is a single-photon-counting hybrid pixel detector developed at the Paul Scherrer Institut, Switzerland. It is designed for applications at synchrotron light sources with photon energies above 5 keV. Features of EIGER include a small pixel size (75 µm × 75 µm), a high frame rate (up to 23 kHz), a small dead-time between frames (down to 3 µs) and a dynamic range up to 32-bit. In this article, the use of EIGER as a detector for electrons in low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) is reported. It is demonstrated that, with only a minimal modification to the sensitive part of the detector, EIGER is able to detect electrons emitted or reflected by the sample and accelerated to 8-20 keV. The imaging capabilities are shown to be superior to the standard microchannel plate detector for these types of applications. This is due to the much higher signal-to-noise ratio, better homogeneity and improved dynamic range. In addition, the operation of the EIGER detector is not affected by radiation damage from electrons in the present energy range and guarantees more stable performance over time. To benchmark the detector capabilities, LEEM experiments are performed on selected surfaces and the magnetic and electronic properties of individual iron nanoparticles with sizes ranging from 8 to 22 nm are detected using the PEEM endstation at the Surface/Interface Microscopy (SIM) beamline of the Swiss Light Source. [ABSTRACT FROM AUTHOR]

Published
2017
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15. Towards hybrid pixel detectors for energy-dispersive or soft X-ray photon science.

Author

Jungmann-Smith, J. H., Bergamaschi, A., Brückner, M., Cartier, S., Dinapoli, R., Greiffenberg, D., Huthwelker, T., Maliakal, D., Mayilyan, D., Medjoubi, K., Mezza, D., Mozzanica, A., Ramilli, M., Ruder, Ch., Schädler, L., Schmitt, B., Shi, X., and Tinti, G.

Subjects
PHOTONS, X-ray detection, PIXELS
Abstract

JUNGFRAU (adJUstiNg Gain detector FoR the Aramis User station) is a two-dimensional hybrid pixel detector for photon science applications at free-electron lasers and synchrotron light sources. The JUNGFRAU 0.4 prototype presented here is specifically geared towards low-noise performance and hence soft X-ray detection. The design, geometry and readout architecture of JUNGFRAU 0.4 correspond to those of other JUNGFRAU pixel detectors, which are charge-integrating detectors with 75 µm × 75 µm pixels. Main characteristics of JUNGFRAU 0.4 are its fixed gain and r.m.s. noise of as low as 27 e− electronic noise charge (<100 eV) with no active cooling. The 48 × 48 pixels JUNGFRAU 0.4 prototype can be combined with a charge-sharing suppression mask directly placed on the sensor, which keeps photons from hitting the charge-sharing regions of the pixels. The mask consists of a 150 µm tungsten sheet, in which 28 µm-diameter holes are laser-drilled. The mask is aligned with the pixels. The noise and gain characterization, and single-photon detection as low as 1.2 keV are shown. The performance of JUNGFRAU 0.4 without the mask and also in the charge-sharing suppression configuration (with the mask, with a `software mask' or a `cluster finding' algorithm) is tested, compared and evaluated, in particular with respect to the removal of the charge-sharing contribution in the spectra, the detection efficiency and the photon rate capability. Energy-dispersive and imaging experiments with fluorescence X-ray irradiation from an X-ray tube and a synchrotron light source are successfully demonstrated with an r.m.s. energy resolution of 20% (no mask) and 14% (with the mask) at 1.2 keV and of 5% at 13.3 keV. The performance evaluation of the JUNGFRAU 0.4 prototype suggests that this detection system could be the starting point for a future detector development effort for either applications in the soft X-ray energy regime or for an energy-dispersive detection system. [ABSTRACT FROM AUTHOR]

Published
2016
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16. Radiation hardness assessment of the charge-integrating hybrid pixel detector JUNGFRAU 1.0 for photon science.

Author

Jungmann-Smith, J. H., Bergamaschi, A., Brückner, M., Cartier, S., Dinapoli, R., Greiffenberg, D., Jaggi, A., Maliakal, D., Mayilyan, D., Medjoubi, K., Mezza, D., Mozzanica, A., Ramilli, M., Ruder, Ch., Schädler, L., Schmitt, B., Shi, X., and Tinti, G.

Subjects
FREE electron lasers, SYNCHROTRON radiation, HARDNESS, IRRADIATION, OPTICAL amplifiers
Abstract

JUNGFRAU (adJUstiNg Gain detector FoR the Aramis User station) is a two-dimensional hybrid pixel detector for photon science applications in free electron lasers, particularly SwissFEL, and synchrotron light sources. JUNGFRAU is an automatic gain switching, charge-integrating detector which covers a dynamic range of more than 104 photons of an energy of 12 keV with a good linearity, uniformity of response, and spatial resolving power. The JUNGFRAU 1.0 application-specific integrated circuit (ASIC) features a 256 x 256 pixel matrix of 75 x 75 µm² pixels and is bump-bonded to a 320 µm thick Si sensor. Modules of 2 x 4 chips cover an area of about 4 x 8 cm². Readout rates in excess of 2 kHz enable linear count rate capabilities of 20 MHz (at 12 keV) and 50 MHz (at 5 keV). The tolerance of JUNGFRAU to radiation is a key issue to guarantee several years of operation at free electron lasers and synchrotrons. The radiation hardness of JUNGFRAU 1.0 is tested with synchrotron radiation up to 10 MGy of delivered dose. The effect of radiation-induced changes on the noise, baseline, gain, and gain switching is evaluated post-irradiation for both the ASIC and the hybridized assembly. The bare JUNGFRAU 1.0 chip can withstand doses as high as 10 MGy with minor changes to its noise and a reduction in the preamplifier gain. The hybridized assembly, in particular the sensor, is affected by the photon irradiation which mainly shows as an increase in the leakage current. Self-healing of the system is investigated during a period of 11 weeks after the delivery of the radiation dose. Annealing radiation-induced changes by bake-out at 100 °C is investigated. It is concluded that the JUNGFRAU 1.0 pixel is sufficiently radiation-hard for its envisioned applications at SwissFEL and synchrotron beam lines. [ABSTRACT FROM AUTHOR]

Published
2015
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19. The high speed, high dynamic range camera AGIPD.

Author

Becker, J., Bianco, L., Gottlicher, P., Graafsma, H., Hirsemann, H., Jack, S., Klyuev, A., Lange, S., Marras, A., Rah, S., Sheviakov, I., Trunk, U., Zhang, J., Zimmer, M., Klanner, R., Schwandt, J., Dinapoli, R., Greiffenberg, D., Mozzanica, A., and Schmitt, B.

Published
2013
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21. AGIPD - The adaptive gain integrating pixel detector for the European XFEL development and status.

Author

Becker, J., Gottlicher, P., Graafsma, H., Hirsemann, H., Jack, S., Klyuev, A., Lange, S., Marras, A., Nilsson, B., Tian, F., Trunk, U., Klanner, R., Schwandt, J., Zhang, J., Dinapoli, R., Greiffenberg, D., Henrich, B., Mozzanica, A., Schmitt, B., and Shi, X.

Abstract

The European XFEL [1] will provide fully coherent, 100 fs X-ray pulses, with up to 1012 photons at 12 keV. The high intensity per pulse will allow recording diffraction patterns of single particles or small crystals in a single shot. Consequently 2D-detectors have to cope with a large dynamic range: detection from single photon to > 104 photons/pixel in the same image. An additional challenge is the European XFEL machine: an Electron bunch train with 10 Hz repetition rate, consisting of up to 2,700 bunches with a 220 ns spacing. Recorded images have to be stored inside the pixel during the bunch trains and readout in between. To meet these requirements, the European XFEL has launched 3 detector development projects. The AGIPD project is a collaboration between DESY, PSI and the Universities of Bonn and Hamburg. The goal is a 1024 × 1024 pixel detector, with 200 µm pixel size and a central hole for the primary beam. The ASIC operates in charge integration mode: the output of each pixels preamplifier is proportional to the charge from the sensor generated by the X-rays. The input stage of the pixel cells uses dynamically adjustable gains. The output signal is stored in an analogue memory, which has to be a compromise between noise performance and the number of images. This is operated in random access mode, providing means to overwrite bad frames for optimal use of the 352 memory cells per pixel, which have to be readout and digitized in the 99.4ms bunch gap. The detector will be built of 8 × 2 fully depleted monolithic silicon sensors with a 8 × 2 array of CMOS readout chips bump-bonded to these. Several prototypes of the readout ASIC have been produced. The results presented originate from the 16 × 16 pixel matrices AGIPD 0.2, which was bump-bonded to a pixel sensor, and AGIPD 0.3, which includes the intended control algorithm and a fast differential interface to the off-chip world. [ABSTRACT FROM PUBLISHER]

Published
2011
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28. X-ray Detector Development at the Swiss Light Source.

Author

Bergamaschi, A., Cartier, S., Dinapoli, R., Greiffenberg, D., Johnson, I., Mezza, D., Mozzanica, A., Schmitt, B., Shi, X., Jungmann-Smith, J., and Tinti, G.

Subjects
PHOTON detectors, SYNCHROTRONS, PHOTON counting, INTEGRATED circuit interconnections, CHARGE sharing (Digital electronics)
Abstract

The SLS detectors group has a longstanding history in the development of hybrid X-ray detectors for synchrotrons [1]. Hybrid detectors consist of a sensor (usually silicon) absorbing the photons and front-end electronics transforming the charge into a measurable signal. The two parts are distinct and can therefore be optimized separately, depending on the application. The group has the know-how to design sensors and Read-Out Chips (ROC) in-house, assemble the detectors with a high yield for a large number of channels (both wire- and bump-bonding), and develop data acquisition systems and software. The detectors must provide high-quality data and be reliable for the daily user operation at the beamlines. They are normally developed to target specific applications, and particular effort is put into the integration of the systems at the beamlines and on their reliability. The detector group works in close connection with the beamline scientists of the SLS as early as the development phase and then later to train them in operating the detectors in an optimized way and in supporting the final users. [ABSTRACT FROM AUTHOR]

Published
2014
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29. Detector Developments for Hard X-rays at DESY: Cutting-Edge Systems for Cutting-Edge Light Sources.

Author

Pennicard, D., Becker, J., Allahgholi, A., Bianco, L., Dinapoli, R., Goettlicher, P., Graafsma, H., Greiffenberg, D., Hirsemann, H., Jack, S., Klanner, R., Klyuev, A., Krueger, H., Lange, S., Mozzanica, A., Marras, A., Rah, S., Rothkirch, A., Schmitt, B., and Schwandt, J.

Subjects
HARD X-rays, FREE electron lasers, SYNCHROTRONS, PHOTON detectors, SIGNAL processing
Abstract

With the continual drive towards bigger, better, and brighter light sources, whole new areas of scientific research are possible that would have been unimaginable or even were believed impossible before. For example, imaging of single bioparticles has been demonstrated at Free Electron Lasers (FELs) [1], and synchrotron beamlines can now be used to study real-time changes in samples on a timescale of milliseconds. [ABSTRACT FROM AUTHOR]

Published
2014
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31. Capturing dynamics with Eiger, a fast-framing X-ray detector.

Author

Johnson, I., Bergamaschi, A., Buitenhuis, J., Dinapoli, R., Greiffenberg, D., Henrich, B., Ikonen, T., Meier, G., Menzel, A., Mozzanica, A., Radicci, V., Satapathy, D. K., Schmitt, B., and Shi, X.

Subjects
X-ray photoelectron spectroscopy, PHOTON correlation, X-ray scattering, COLLOID analysis, PIXELS
Abstract

Eiger is the next-generation single-photon-counting pixel detector following the widely used Pilatus detector. Its smaller pixel size of 75 µm × 75 µm, higher frame rate of up to 22 kHz, and practically zero dead-time (∼4 µs) between exposures will further various measurement methods at synchrotron sources. In this article Eiger's suitability for X-ray photon correlation spectroscopy (XPCS) is demonstrated. By exploiting its high frame rate, complementary small-angle X-ray scattering (SAXS) and XPCS data are collected in parallel to determine both the structure factor and collective diffusion coefficient of a nano-colloid suspension. For the first time, correlation times on the submillisecond time scale are accessible with a large-area pixel detector. [ABSTRACT FROM AUTHOR]

Published
2012
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37. New calibration circuitry and concept for AGIPD.

Author

Mezza, D., Allahgholi, A., Delfs, A., Dinapoli, R., Goettlicher, P., Graafsma, H., Greiffenberg, D., Hirsemann, H., Klyuev, A., Laurus, T., Marras, A., Mozzanica, A., Perova, I., Poehlsen, J., Schmitt, B., Sheviakov, I., Shi, X., Trunk, U., Xia, Q., and Zhang, J.

Published
2016
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39. The adaptive gain integrating pixel detector.

Author

Allahgholi, A., Becker, J., Bianco, L., Bradford, R., Delfs, A., Dinapoli, R., Goettlicher, P., Gronewald, M., Graafsma, H., Greiffenberg, D., Henrich, B. H., Hirsemann, H., Jack, S., Klanner, R., Klyuev, A., Krueger, H., Lange, S., Marras, A., Mezza, D., and Mozzanica, A.

Published
2016
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