1. Dielectric microscopy with submillimeter resolution.
- Author
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Greeney, Nathan S. and Scales, John A.
- Subjects
- *
CRYSTALLOGRAPHY , *TELECOMMUNICATION systems , *MINERALOGY , *WAVEGUIDES , *DIELECTRIC devices , *SUBMILLIMETER waves - Abstract
In analogy with optical near-field scanning methods we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying dielectric properties of materials with subwavelength resolution. Using a 150 GHz probe in transmission mode we see spatial resolution of better than 500 μm. Here, we apply the technique to rocks map the mineralogy at the submillimeter scale. [ABSTRACT FROM AUTHOR]
- Published
- 2007
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