1. Growth of polycrystalline Pr4Ni3O10 thin films for intermediate temperature solid oxide fuel cell cathode by radio frequency magnetron co-sputtering
- Author
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Yuhei Kikuchi, Quentin Simon, Fabien Giovannelli, Patrick Laffez, Richard Retoux, Ayako Yamamoto, GREMAN (matériaux, microélectronique, acoustique et nanotechnologies) (GREMAN - UMR 7347), Institut National des Sciences Appliquées - Centre Val de Loire (INSA CVL), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Université de Tours (UT)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de cristallographie et sciences des matériaux (CRISMAT), École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Normandie Université (NU)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Institut de Chimie du CNRS (INC), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Université de Tours-Centre National de la Recherche Scientifique (CNRS), Université de Tours (UT)-Institut National des Sciences Appliquées - Centre Val de Loire (INSA CVL), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Shibaura Institute of Technology, Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), and Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)
- Subjects
Materials science ,Annealing (metallurgy) ,Scanning electron microscope ,Energy-dispersive X-ray spectroscopy ,02 engineering and technology ,01 natural sciences ,law.invention ,Solid oxide fuel cell ,Sputtering ,law ,Seebeck coefficient ,0103 physical sciences ,Materials Chemistry ,Thin film ,010302 applied physics ,Metals and Alloys ,[CHIM.MATE]Chemical Sciences/Material chemistry ,Surfaces and Interfaces ,021001 nanoscience & nanotechnology ,Cathode ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,Chemical engineering ,Praseodymium nickelate ,[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] ,0210 nano-technology - Abstract
International audience; The performances of Solid Oxide Fuel Cells (SOFC) are strongly related to the catalytic/conductive properties of cathode materials, which are temperature dependent. The optimal temperature in operating conditions implies a tradeoff between high efficiency at high temperatures and improved lifetime at Intermediate Temperatures (IT). Among the candidates, Pr2NiO4 presents attractive functional properties but is susceptible to decompose into Pr4Ni3O10 under IT-SOFC conditions. In this contribution, a deposition process to obtain Pr4Ni3O10 phase were directly targeted as a potential alternative to the integration of Pr2NiO4 in IT-SOFC. Pr4Ni3O10 thin films have been deposited on Y-stabilized Zirconia substrates through a two-step process: (i) room temperature co-sputtering of metallic Ni and Pr targets, (ii) ex-situ annealing under O2 flux. The composition of thin films were adjusted by changing the power applied to each target and confirmed by Energy Dispersive Spectroscopy. X-Ray Diffraction analyses as a function of temperature were made to identify the temperature window to stabilize the desired phase. The structural and morphological features of polycrystalline Pr4Ni3O10 thin films were analyzed by Transmission Electron Microscopy and Scanning Electron Microscopy. Electrical resistivity of ~6.5.10−3 Ω cm and Seebeck coefficient of ~ – 23 μV K−1 at 150 °C highlight the synthesis of Pr4Ni3O10 continuous coatings representing a promising candidate for cathodes in IT-SOFC.
- Published
- 2020