Search

Vat photopolymerization (VP) is a rapidly growing category of additive manufacturing. As VP methods mature the expectation is that the quality of printed parts will be highly reproducible. At present, detailed characterization of the light engines used in liquid crystal display (LCD)-based VP systems is lacking and so it is unclear if they are built to sufficiently tight tolerances to meet the current and/or future needs of additive manufacturing. Herein, we map the irradiance, spectral characteristics, and optical divergence of a nominally 405 nm LCD-based VP light engine. We find that there is notable variation in all of these properties as a function of position on the light engine that cause changes in extent of polymerization and surface texture. We further demonstrate through a derived photon absorption figure of merit and through printed test parts that the spatial heterogeneity observed in the light engine is significant enough to affect part fidelity. These findings help to explain several possible causes of variable part quality and also highlight the need for improved optical performance on LCD-based VP printers.

After we replaced the argon mini-arc with a laser-driven light source in the Ultraviolet Spectral Comparator Facility at the National Institute of Standards and Technology (NIST), we realized that the optical power should be sufficient to use the comparator system for absolute-cryogenic radiometry. Calibrating working standard detectors directly against an absolute-cryogenic radiometer in the system used for calibrations would eliminate all uncertainties resulting from the use of transfer standards, which were calibrated in a separate system using a different light source and optics. The transfer standards are the middlemen we refer to in the title. Any uncertainty caused by differences in bandpass, out-off-band radiation, spectral purity, collimation, or data interpolation would be removed. In the end, we successfully set up a twin system resembling the Ultraviolet Spectral Comparator Facility and used this system to perform a primary calibration of several photodiodes, based on an absolute-cryogenic radiometer. Using this system, we were able to reduce relative standard uncertainties at wavelengths below 220 nm from above 1 % ( k = 1 ) to below 0.5%. We refer to this system as the Ultraviolet Scale Realization Facility or UV-SRF.

We have developed a new method for the exact calculation of synchrotron radiation for the National Institute of Standards and Technology Synchrotron Ultraviolet Radiation Facility, SURF III. Instead of using the Schwinger formula, which is only an approximation, we develop formulae based on Graf’s addition theorem for Bessel functions and accurate asymptotic expansions for Hankel functions and Bessel functions. By measuring the radiation intensity profile at two distances from the storage ring, we also confirm an apparent vertical emittance that is consistent with the vertical betatron oscillations that are intentionally introduced to extend beam lifetime by spreading the electron beam spatially. Finally, we determine how much diffraction by beamline apertures enhances the spectral irradiance at an integrating sphere entrance port at the end station. This should eliminate small but treatable components of the uncertainty budget that one should consider when using SURF III or similar synchrotrons as standard, calculable sources of ultraviolet and other radiation. https://doi.org/10.1063/1.5018412

At present, broadband radiometric measurements of LEDs with uniform and low-uncertainty results are not available. Currently, either complicated and expensive spectral radiometric measurements or broadband photometric LED measurements are used. The broadband photometric measurements are based on the CIE standardized V(λ) function, which cannot be used in the UV range and leads to large errors when blue or red LEDs are measured in its wings, where the realization is always poor. Reference irradiance meters with spectrally constant response and high-intensity LED irradiance sources were developed here to implement the previously suggested broadband radiometric LED measurement procedure [1, 2]. Using a detector with spectrally constant response, the broadband radiometric quantities of any LEDs or LED groups can be simply measured with low uncertainty without using any source standard. The spectral flatness of filtered-Si detectors and low-noise pyroelectric radiometers are compared. Examples are given for integrated irradiance measurement of UV and blue LED sources using the here introduced reference (standard) pyroelectric irradiance meters. For validation, the broadband measured integrated irradiance of several LED-365 sources were compared with the spectrally determined integrated irradiance derived from an FEL spectral irradiance lamp-standard. Integrated responsivity transfer from the reference irradiance meter to transfer standard and field UV irradiance meters is discussed.

Imaging an electron beam with visible light is a common method of diagnostics applied to electron accelerators. It is a straightforward way to deduce the transverse electron distribution as well as its changes over time. The electrons stored in the Synchrotron Ultraviolet Radiation Facility (SURF) III at the National Institute of Standards and Technology (NIST) were studied over an extended period of time to characterize the upgraded accelerator. There is good agreement between experimental and theoretical horizontal beam sizes at three different electron energies.

This paper reports novel measurements of x-ray optical radiation on an absolute scale from the intense and ultra-short radiation generated in the soft x-ray regime of a free electron laser. We give a brief description of the detection principle for radiation measurements which was specifically adapted for this photon energy range. We present data characterizing the soft x-ray instrument at the Linac Coherent Light Source (LCLS) with respect to the radiant power output and transmission by using an absolute detector temporarily placed at the downstream end of the instrument. This provides an estimation of the reflectivity of all x-ray optical elements in the beamline and provides the absolute photon number per bandwidth per pulse. This parameter is important for many experiments that need to understand the trade-offs between high energy resolution and high flux, such as experiments focused on studying materials via resonant processes. Furthermore, the results are compared with the LCLS diagnostic gas detectors to test the limits of linearity, and observations are reported on radiation contamination from spontaneous undulator radiation and higher harmonic content.

A new facility for measuring irradiance in the UV was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility as the primary standard. To measure the irradiance from a source under test, an integrating sphere spectrometer-detector system measures both the source under test and the synchrotron radiation sequentially, and the irradiance from the source under test can be determined. In particular, we discuss the calibration of deuterium lamps using this facility from 200 to 400 nm. This facility improves the current NIST UV irradiance scale to a relative measurement uncertainty of 1.2% (k=2).

These proceedings are a collection of the articles presented at the seventeenth Pan-American Synchrotron Radiation Instrumentation Conference SRI2013, held on the campus of the National Institute of Standards and Technology (NIST), located in Gaithersburg, Maryland, United States of America, 19–21 June, 2013. SRI2013 was jointly hosted by the Cornell University Cornell High Energy Synchrotron Source (CHESS), the Thomas Jefferson National Accelerator Facility (Jefferson Lab), and the Synchrotron Ultraviolet Radiation Facility (SURF III) at NIST. This meeting's focus was clearly on instrumentation, thus fulfilling the intent of this SRI meeting series, which was initiated at NIST, then the National Bureau of Standards (NBS), in 1979. SRI2013 hosted more than 150 delegates, despite the new US governmental travel restrictions. This proceedings series aims to be an essential reference work for practitioners in the field. It primarily documents the evolution and development of techniques, but also recent scientific advances, that were presented during the two and a half days of the conference. We are extremely thankful to all the authors who contributed to making these proceedings a volume of reference as well as to the reviewers for their careful reading and constructive recommendations for improving the articles. Great thanks go to Robert Dragoset at NIST, for creating and maintaining the conference website and generating the conference logo. We are also thankful for the excellent support we received from the Conference Program at NIST, especially Kathy Kilmer and Angela Ellis. And we would like to dedicate these proceedings to the memory of Kathy Kilmer, who passed away on 15 October, 2013. NIST will not be the same without her. The Co-Editors: Uwe Arp (SURF/NIST) Peter Reversz (CHESS) Gwyn P Williams (Jefferson Lab)

Strong evidence for self-excited emission of coherent synchrotron radiation in the microwave spectral region was observed at the Synchrotron Ultraviolet Radiation Facility (SURF III) electron storage ring at the NIST. The microwave emission between 25 and 35 mm was dominated by intense bursts of radiation. The intensity enhancement during these bursts was on the order of 10 000 to 50 000 over the incoherent value. The shape, width, and period of the bursts depend strongly on the operational parameters of the storage ring. Coherent microwave emission was observed only when the beam was unstable, namely, during bunch-length relaxation oscillations. We report on the measurements of the microwave bursts, and correlate the data with signals from a beam monitor electrode and photodiode detector. The coherent enhancement of the radiation intensity is ascribed to spontaneous self-induced microbunching of the electrons within the bunch.

The National Institute of Standards and Technology operates two spectral comparator facilities, both of which are used to provide detector calibrations from the ultraviolet to the near-infrared spectral range. One, the Ultraviolet Spectral Comparator Facility (UV SCF), has been in operation for more than two decades, providing one of the core calibration services. Recently, the illumination source used in the UV SCF has been changed from an argon mini-arc source to a laser-driven plasma light source. This new source has higher brightness, a smaller source size, better temporal stability, and much better conversion efficiency than the previous source. The improvements in the capabilities are summarized.

Argon L{sub 2.3}-M{sub 2.3}M{sub 2.3} Auger-electron spectra were measured in coincidence with K{alpha} fluorescent x-rays in studies of Ar K-shell vacancy decays at several photon energies above the K-threshold and on the 1s-4p resonance in atomic argon. The complex spectra recorded by conventional electron spectroscopy are greatly simplified when recorded in coincidence with fluorescent x-rays, allowing a more detailed analysis of the vacancy cascade process. The resulting coincidence spectra are compared with Hartree-Fock calculations which include shake-up transitions in the resonant case. Small energy shifts of the coincidence electron spectra are attributed to post-collision interaction with 1s photoelectrons.

An inner-shell vacancy in an atom decays by an intricate combination of Auger and fluorescence processes. The interrelation between these processes is not well understood because traditional studies of core-excited atoms focus on only one of the many particles that participate in the relaxation - largely ignoring the other components and the correlations between them. To understand these correlations we developed a coincidence technique that uses coincident detection of X-rays and electrons to select decay pathways that involve emission of both an X-ray photon and electrons. In the first application of this technique, the Ar 1s photoelectron spectrum was recorded selectively in coincidence with X-ray fluorescence to eliminate the asymmetric broadening and shifting of the energy distribution which results due to post-collision interaction with K-Auger electrons. This allowed the direct observation of the interaction between the photoelectron and the decay of core holes created after the initial photoionization event. We have also applied this technique to the much more complex problem of understanding Auger-electron spectra produced by vacancy cascades following inner-shell excitation. For example, we previously recorded non-coincident electron spectra of L{sub 2,3}MM Auger transitions following K-shell excitation of argon. Interpretation of these spectra is difficult because they are complicatedmore » and consist of many overlapping or unresolved Auger transitions between different ionic states.« less

We have studied the performance of polytetrafluoroethylene integrating spheres in the ultraviolet (UV) region with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was analyzed by a monochromator. Second, a UV laser beam was directed into an integrating sphere, and spectrally dispersed laser induced fluorescence was studied. Significant absorption and fluorescence features were observed in the UV region and attributed to the contamination in the integrating sphere. We demonstrate that integrating spheres are easily contaminated by environmental pollutants such as polycyclic aromatic hydrocarbons emitted from engine exhaust. Baking of the contaminated integrating sphere can reverse some but not all of the effects caused by contaminants. The implications for using integrating spheres for UV measurement are discussed.

A method to include the influence of the vertical electron beam emittance onto the calculability of synchrotron radiation is introduced. It accounts for the finite vertical size and angular spread of the electron beam through a convolution procedure. The resulting angular spread of synchrotron radiation can differ significantly from the ideal Schwinger result, depending on the conditions. For the Synchrotron Ultraviolet Radiation Facility detailed results on the influence of the electron emittance for total power and polarization calculations are presented.