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Tight focusing with very small f-numbers is necessary to achieve the highest at-focus irradiances. However, tight focusing imposes strong demands on precise target positioning in-focus to achieve the highest on-target irradiance. We describe several near-infrared, visible, ultraviolet and soft and hard X-ray diagnostics employed in a ∼1022 W/cm2 laser–plasma experiment. We used nearly 10 J total energy femtosecond laser pulses focused into an approximately 1.3-μm focal spot on 5–20 μm thick stainless-steel targets. We discuss the applicability of these diagnostics to determine the best in-focus target position with approximately 5 μm accuracy (i.e., around half of the short Rayleigh length) and show that several diagnostics (in particular, 3 $\omega$ reflection and on-axis hard X-rays) can ensure this accuracy. We demonstrated target positioning within several micrometers from the focus, ensuring over 80% of the ideal peak laser intensity on-target. Our approach is relatively fast (it requires 10–20 laser shots) and does not rely on the coincidence of low-power and high-power focal planes.

Abstract One of the main difficulties of efficiently generating high-order harmonics in long neutral-gas targets is to reach the phase-matching conditions. The issue is that the medium cannot be sufficiently ionized by the driving laser due to plasma defocusing. We propose a method to improve the phase-matching by pre-ionizing the gas using a weak capillary discharge. We have demonstrated this mechanism, for the first time, in absorption-limited XUV generation by an 800 nm femtosecond laser in argon and krypton. The ability to control phase-mismatch is confirmed by an analytical model and numerical simulations of the entire generation process. Our method allows to increase the efficiency of the harmonic generation significantly, paving the way towards photon-hungry applications of these compact short-wavelength sources.

We study the dynamics of avalanche ionization of pure helium nanodroplets activated by a weak extreme-ultraviolet (XUV) pulse and driven by an intense near-infrared (NIR) pulse. In addition to a transient enhancement of ignition of a nanoplasma at short delay times ${\sim}200$ fs, long-term activation of the nanodroplets lasting up to a few nanoseconds is observed. Molecular dynamics simulations suggest that the short-term activation is caused by the injection of seed electrons into the droplets by XUV photoemission. Long-term activation appears due to electrons remaining loosely bound to photoions which form stable ‘snowball’ structures in the droplets. Thus, we show that XUV irradiation can induce long-lasting changes of the strong-field optical properties of nanoparticles, potentially opening new routes to controlling avalanche-ionization phenomena in nanostructures and condensed-phase systems.

One of the main difficulties of efficiently generating high-order harmonics in long neutral-gas targets is to reach the phase-matching conditions. The issue is that the medium cannot be sufficiently ionized by the driving laser due to plasma defocusing. We propose a method to improve the phase-matching by pre-ionizing the gas using a weak capillary discharge. We have demonstrated this mechanism, for the first time, in absorption-limited XUV generation by an 800 nm femtosecond laser in argon and krypton. The ability to control phase-mismatch is confirmed by an analytical model and numerical simulations of the entire generation process. Our method allows to increase the efficiency of the harmonic generation significantly, paving the way towards photon-hungry applications of these compact short-wavelength sources., (© 2022. The Author(s).)

We present experimental results obtained at a user-oriented XUV beamline implemented at the ELI Beamlines facility. The coherent XUV radiation is produced via high harmonic generation in gases in a loose focusing geometry. The beamline is designed to be driven by 1 kHz, 100 mJ, 20 fs pulses centered at a wavelength of 830 nm. Results such as XUV spectra, beam wavefront and pulse energy obtained during the beamline commissioning with a commercial 1 kHz, 5 mJ, 40 fs laser system are presented. A unique XUV spectrometer for source characterization designed to reach a very high sensitivity is described in detail, and we demonstrate a novel technique for single-shot and every-shot XUV pulse energy measurement.