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1. Pseudo-potential Band Structure Calculation of InSb Ultra-thin Films and its application to assess the n-Metal-Oxide-Semiconductor Transistor Performance

3. Two citrus KNAT-like genes, CsKN1 and CsKN2, are involved in the regulation of spring shoot development in sweet orange

4. CiKN1 and CiKN6 are involved in leaf development in citrus by regulating CimiR164

6. Cellular Mechanisms of Hepatoprotection Mediated by M2-Like Macrophages

7. High-performance microwave coplanar bandpass and bandstop filters on Si substrates

9. Localized oxide degradation in ultrathin gate dielectric and its statistical analysis

10. Investigation of hole-tunneling current through ultrathin oxynitride/oxide stack gate dielectrics in p-MOSFETs

12. A simple and efficient model for quantization effects of hole inversion layers in MOS devices

13. Hole quantization effects and threshold voltage shift in pMOSFET-assessed by improved one-band effective mass approximation

14. Analysis of the DCIV peaks in electrically stressed pMOSFETS

16. Uniaxial strain effect on the electronic and optical properties of wurtzite GaN-AlGaN quantum well lasers

17. Electronic band structures and optical gain spectra of strained wurtzite GaN-AlxGa1-xN quantum-well lasers

18. Different Effects of Plasma from Patients with Acute on Chronic Liver Failure on the Proliferation and Biotransformation Function of C3A Cells

20. Extraction of Channel Electron Effective Mobility in InGaAs/Al2O3 n-FinFETs

21. Experimental Investigation of Border Trap Generation in InGaAs nMOSFETs With Al2O3 Gate Dielectric Under PBTI Stress

22. [Prospective study of Han's acupoint nerve stimulator for preventing relapse of detoxified heroin addicts]

23. Electronic transport in InGaAs/Al2O3 nFinFETs

24. Use of remote-trip cameras for wildlife surveys and evaluating the effectiveness of conservation activities at a nature reserve in Sichuan province, China

25. Reliability of High-Mobility InGaAs Channel n-MOSFETs Under BTI Stress

26. A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs

31. Work Function Tunability of Refractory Metal Nitrides by Lanthanum or Aluminum Doping for Advanced CMOS Devices

35. Investigations of Conduction Mechanisms of the Self-Rectifying n+Si-HfO2–Ni RRAM Devices.

36. Metal Gate Work-Function Engineering on Gate Leakage of MOSFETs.

37. ELECTRONIC STRUCTURE OF THE DIVACANCY IN SEMICONDUCTORS (II)——ENERGY LEVELS AND A SIMPLE PHYSICAL MODEL

38. A1 SYMMETRIC DEEP LEVEL WAVEFUNCTION OF SUBSTITUTIONAL DEFECT PAIRS IN GaP

39. ELECTRONIC STRUCTURE OF THE DIVACANCY IN SEMICONDUCTORS (Ⅰ)——BASIC EQUATIONS

40. THEORY OF T2 SYMMETRIC DEEP LEVEL WAVE FUNCTIONS IN Si

41. STRESS DEPENDENCE OF DEFECT LEVELS IN SEMICONDUCTORS

42. THE BEHAVIOR OF DEEP LEVEL WAVEFUNCTIONS IN SHALLOW ENERGY REGION

43. DISTRIBUTION CHARACTERISTICS OF DEEP LEVEL WAVEFUNCTIONS IN BLOCH SPACE

44. ELECTRONIC STRUCTURE OF THE DIVACANCY IN CUBIC SEMICONDUCTORS (Ⅲ)——WAVEFUNCTIONS OF THE DIVACANCY STATES IN SI

45. HYDROSTATIC PRESSURE DEPENDENCE OF GOLD ACCEPTOR LEVELS IN Si

46. ELECTRONIC STRUCTURE OF THE DIVACANCY IN CUBIC SEMICONDUCTORS (Ⅳ)——WAVEFUNCTIONS OF THE DIVACANCY STATES IN GaAs AND GaP

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