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A new strategic plan is in place to upgrade the ALS so it can continue to address fundamental questions, such as size-dependent and dimensional-confinement phenomena at the nanoscale; correlation and complexity in physical, biological, and environmental systems; and temporal evolution, assembly, dynamics and ultrafast phenomena. Moreover, the growing number of ALS users (now exceeding 2,000 per year) requires increased attention. Accordingly, our plan concentrates on projects that will continue to make it possible for ALS users to address grand scientific and technological challenges with incisive world-class tools and quality user support. Our highest priority is to begin top-off operation, in which electrons are injected into the storage ring at intervals of approximately 1 minute. The combination of top-off and concurrent development of small-gap in-vacuum undulators and superconducting undulators will allow an increase in brightness from eight to more than 100 times, depending on the specific undulators and photon energy range. As part of our core mission in the VUV and soft x-ray regions, we plan to exploit these accelerator developments to extend our capabilities for high spatial and temporal resolution and utilize the remarkable coherence properties of the ALS in a new generation of beamlines. Ranked by priority, several proposed beamlines will follow completion of five new beamlines already under construction or funded. The intellectual excitement of the ALS has been a powerful tool in the recruitment and retention of outstanding staff, but additional sustained efforts are required to increase diversity both in gender and in underrepresented groups. To this end, we intend to expand the ALS Doctoral Fellowship Program by giving special emphasis to underrepresented groups. We also envision a distinguished postdoctoral fellowship program with the same emphasis, to increase and diversify our pool of candidates for beamline scientist positions.

Examines the imaging process by Fourier transform X-ray holography. Advantages of the method; Development of the conceptual foundation; The use of undulator radiation; Limited resolution; Importance of stability; Recording and processing with a DEC VAXstation computer; Displays of results.

In x-ray diffraction microscopy, iterative algorithms retrieve reciprocal space phase information, and a real space image, from an object's coherent diffraction intensities through the use of a priori information such as a finite support constraint. In many experiments, the object's shape or support is not well known, and the diffraction pattern is incompletely measured. We describe here computer simulations to look at the effects of both of these possible errors when using several common reconstruction algorithms. Overly tight object supports prevent successful convergence; however, we show that this can often be recognized through pathological behavior of the phase retrieval transfer function. Dynamic range limitations often make it difficult to record the central speckles of the diffraction pattern. We show that this leads to increasing artifacts in the image when the number of missing central speckles exceeds about 10, and that the removal of unconstrained modes from the reconstructed image is helpful only when the number of missing central speckles is less than about 50. This simulation study helps in judging the reconstructability of experimentally recorded coherent diffraction patterns.

X-ray diffraction microscopy complements other x-ray microscopy methods by being free of lens-imposed radiation dose and resolution limits, and it allows for high-resolution imaging of biological specimens too thick to be viewed by electron microscopy. We report here the highest resolution (11-13 nm) x-ray diffraction micrograph of biological specimens, and a demonstration of molecular-specific gold labeling at different depths within cells via through-focus propagation of the reconstructed wavefield. The lectin concanavalin A conjugated to colloidal gold particles was used to label the alpha-mannan sugar in the cell wall of the yeast Saccharomyces cerevisiae. Cells were plunge-frozen in liquid ethane and freeze-dried, after which they were imaged whole using x-ray diffraction microscopy at 750 eV photon energy.

We have used the method of x-ray diffraction microscopy to image the complex-valued exit wave of an intact and unstained yeast cell. The images of the freeze-dried cell, obtained by using 750-eV x-rays from different angular orientations, portray several of the cell's major internal components to 30-nm resolution. The good agreement among the independently recovered structures demonstrates the accuracy of the imaging technique. To obtain the best possible reconstructions, we have implemented procedures for handling noisy and incomplete diffraction data, and we propose a method for determining the reconstructed resolution. This work represents a previously uncharacterized application of x-ray diffraction microscopy to a specimen of this complexity and provides confidence in the feasibility of the ultimate goal of imaging biological specimens at 10-nm resolution in three dimensions.

The x-ray absorption cross section of argon was measured in the 1.3-3.8-nm wavelength region. To correct for the presence of higher orders in the monochromator output, a variable pressure technique is used. The results are in good agreement with semiempirical calculations and earlier measurements.