Search

In this paper, a hybrid uniplanar compact electromagnetic bandgap (UC-EBG) design is proposed with a wide-band noise suppression in power planes of printed circuit boards (PCBs). To achieve wide-band noise suppression, the proposed hybrid UC-EBG design employs a combination of various uniplanar EBG unit cells with different sizes which have different frequency ranges of noise suppression corresponding to the size of the cells. In addition, an analytic model of the EBG unit cell composed of cavity resonant model and meander line inductance is proposed and validated by 3-dimensional field simulation and measurement. To demonstrate the proposed design, a heterogeneous group of unit cells with different sizes was selected and the noise transfer function was compared with that of a conventional UC-EBG structure. The proposed hybrid UC-EBG design is experimentally verified by noise transfer function measurement with a significant expansion of the stopband up to 478 % in comparison to the conventional uniplanar EBG designs with the same area occupation.

In this paper, a simulation-based system-level conducted susceptibility (CS) testing method for a wireless power transfer (WPT) system is proposed. The proposed method employs 3-dimensional electromagnetic (3D EM) models as well as equivalent circuit models to replace the measurement-based CS testing method based on the International Electrotechnical Commission 61000-4-6 standard. The conducted-noise source and equipment under test (EUT) are modeled in a circuit simulator. The conduction path, bulk current injection probe, and calibration jig are modeled using the 3D field simulator. A simple WPT system is designed and fabricated as the EUT for the CS test. The proposed method is successfully verified by comparing the voltage waveforms with measurement-based CS testing method. Additionally, as an application of the proposed method, a simulation-based evaluation of the conducted-noise filters is conducted. By using the proposed method, it is expected that the time and cost expense of setting up the test setup, as well as the testing procedure for the conventional measurement-based CS testing, will be drastically reduced. In addition, the proposed method can be used to estimate the conducted immunity of a system in the early stage of the design cycle prior to production.