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The objective of this research was to investigate and compare the effects of various protein or protein-based powders (WPC, SPI, BSA and hemoglobin) addition on transform of texture properties in egg white (EW)/egg yolk (EY) gels. Results showed that the highest hardness value (38.5 N) was detected in BSA-treated EW gels, while the lowest values (46.6 N) were obtained in hemoglobin-treated EY gels. Additionally, significantly increased value of free –SH groups was obtained in SPI/BSA/hemoglobin-treated EW/EY solutions, and increased value of protein solubility was obtained in EY solutions treated by WPC/SPI/BSA/hemoglobin relative to those of the control. The EW solutions treated by BSA/hemoglobin reached significantly higher H0 values than those of other groups. SDS-PAGE analysis showed that the hemoglobin-treated EW solution had slightly intense bands of ovoinhibitor, ovotransferrin and ovalbumin, and the EY solutions treated by WPC/SPI/BSA had higher level of covalent crosslinking. The EW gels treated by WPC/hemoglobin exhibited relatively more ordered protein secondary structures (α-helix and β-sheet) than those of the SPI group. SEM results suggested that WPC/BSA-treated EW gels developed uniform, porous and fiber-like structure, while SPI/BSA-treated EY gels developed rougher structure.

Recent trends in semiconductor process engineering have resulted in significant adoption of new materials and processes to enable new paradigms in device manufacturing. One such emerging process is area selective deposition where a material can be selectively deposited on an area of interest. In this work, we have demonstrated selective deposition of ruthenium (Ru) on amorphous (a-Si) and polycrystallized silicon (p-Si) to silicon dioxide (SiO2) on both 2D blanket films as well as 3D annealed SiO2–Si multilayer stacks. Amorphous Si once crystallized using high temperature annealing exhibits reduced surface hydrogen content (–Si–H), yet we observed Ru growth on p-Si films that were annealed under multiple conditions (800, 900, and 1000 °C). We have used a combination of Fourier transform-infrared spectroscopy and x-ray photoelectron spectroscopy (XPS) to show that both –Si–H and film crystallinity impact the selective growth of Ru. We have also demonstrated selective deposition of ∼10 nm Ru on p-Si layers and ∼0 nm Ru on SiO2 layers of the annealed 3D SiO2–Si multilayer stack. Additionally, by using a combination of XPS and transmission electron microscopy, we have demonstrated that Ru growth is higher on nongrowth surfaces in 2D substrates than on 3D stacks. Finally, we have shown that this process technology can be further advanced using a combination of selective and nonselective conformal atomic layer deposition processes to develop a novel 3D annealed SiO2–Si multilayer stack, thereby demonstrating a 3D device with low –H content p-Si films. This study can help us to realize new integration schemes for innovative 3D device structures. [ABSTRACT FROM AUTHOR]

In an earlier report, flyability failures due to siloxanes were investigated comparing disks with either Z-Dol or X-1P lubricant. On the Z-Dol disk, the head-disk interface failed at 47 h (h) and the slider accumulated silicon oxide smears, whereas the X-1P disk did not fail (truncated at 300 h) and the slider remained clean. The contrasting performance was rationalized by an assumed mechanism in which degraded lubricant was essential. In this paper, we demonstrate that siloxanes can be tribochemically converted into silicon oxides without any lubricant on the disk or slider. Lubricant degradation is, therefore, not needed for the formation of silicon oxides from siloxanes. We find that siloxane oligomers on Z-Dol disks form micrometer-sized droplets 100 nm in height, whereas on X-1P disks, siloxanes spread out as a very thin film. The siloxane droplets on Z-Dol disks may lead to flyability failure because they exceed the fly height. The presence or absence of siloxane droplets on disk surfaces may be explained in terms of surface wetting properties characterized by contact angle measurements. Index Terms--Hard disk drive, head-disk interface, head smear, lubricant, silicon oxide, siloxane.