Search

Your search keyword '"Davidson, Jim L."' showing total 4 results
Start Over Author "Davidson, Jim L." Search Limiters Full Text
4 results on '"Davidson, Jim L."'

1. Current conduction mechanism and gas adsorption effects on device parameters of the Pt/SnO(sub x)/diamond gas sensor

Author

Gurbuz, Yasar, Kang, Weng Poo, Davidson, Jim L., and Kerns, David V., Jr.

Subjects
Sensors -- Research, Diamonds -- Research, Microelectronics -- Research, Business, Electronics, Electronics and electrical industries
Abstract

A study was conducted on the sensing performance for oxidizing and reducing gases, current conduction mechanism and gas adsorption effects on device parameters of a Pt/SnO(sub x)/diamond gas sensor. The sensor was sensitive and exhibited high, repeatable and reproducible reaction.The sensor responded in seconds to small concentrations of O2, CO and H2 gases. The detection mechanism of the sensor was ascribed to the change in occupancy ratio of the oxygen vacancies of the adsorptive oxide layer upon oxygen exposure.

Published
1999

3. The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Author

Massachusetts Institute of Technology. Department of Materials Science and Engineering, Hu, Juejun, Du, Qingyang, Arutt, Charles N, Alles, Michael L, Liao, Wenjun, Gong, Huiqi, Davidson, Jim L, Schrimpf, Ronald D, Reed, Robert A, Weller, Robert A, Bolotin, Kirill, Nicholl, Ryan, Pham, Thang Toan, Zettl, Alex, Li, Mo, Alphenaar, Bruce W, Lin, Ji-Tzuoh, Shurva, Pranoy Deb, McNamara, Shamus, Walsh, Kevin M, Feng, Philip X-L, Hutin, Louis, Ernst, Thomas, Homeijer, Brian D, Polcawich, Ronald G, Proie, Robert M, Jones, Jacob L, Glaser, Evan R, Cress, Cory D, Bassiri-Gharb, Nazanin, Massachusetts Institute of Technology. Department of Materials Science and Engineering, Hu, Juejun, Du, Qingyang, Arutt, Charles N, Alles, Michael L, Liao, Wenjun, Gong, Huiqi, Davidson, Jim L, Schrimpf, Ronald D, Reed, Robert A, Weller, Robert A, Bolotin, Kirill, Nicholl, Ryan, Pham, Thang Toan, Zettl, Alex, Li, Mo, Alphenaar, Bruce W, Lin, Ji-Tzuoh, Shurva, Pranoy Deb, McNamara, Shamus, Walsh, Kevin M, Feng, Philip X-L, Hutin, Louis, Ernst, Thomas, Homeijer, Brian D, Polcawich, Ronald G, Proie, Robert M, Jones, Jacob L, Glaser, Evan R, Cress, Cory D, and Bassiri-Gharb, Nazanin

Abstract

The potential of micro and nano electromechanical systems (M and NEMS) has expanded due to advances in materials and fabrication processes. A wide variety of materials are now being pursued and deployed for M and NEMS including silicon carbide (SiC), III–V materials, thin-film piezoelectric and ferroelectric, electro-optical and 2D atomic crystals such as graphene, hexagonal boron nitride (h-BN), and molybdenum disulfide (MoS₂). The miniaturization, functionality and low-power operation offered by these types of devices are attractive for many application areas including physical sciences, medical, space and military uses, where exposure to radiation is a reliability consideration. Understanding the impact of radiation on these materials and devices is necessary for applications in radiation environments., Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0027), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0035), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0036), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0039), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0060)

Published
2017

Catalog

Books, media, physical & digital resources
See catalog results