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Your search keyword '"Carol Boye"' showing total 3 results

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3 results on '"Carol Boye"'

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1. Yield Learning Methodologies and Failure Isolation in Ring Oscillator Circuit for CMOS Technology Research

2. Use of 22 nm Litho SEM Non-visual Defect Data as a Process Quality Indicator

3. Process Window Centering for 22 nm Lithography

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