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32 results on '"testing time"'

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1. Model for Prediction of Testing Time of a Computer Program for Automated Reliability Evaluation of Semiconductor Devices

2. Fatigue State Detection for Tired Persons in Presence of Driving Periods

3. Effect of Material Type and Minimum Diameter of Specimens on the Fatigue Life

4. Improving the Extraction Process of Mehlich 3 Method for Calcareous Soil Nutrients

5. On Estimation of Number of Detectable Software Faults under Budget Constraint

6. New method for determining P‐S‐N curves in terms of equivalent fatigue lives.

7. Stochastic optimization of laboratory test workflow at metallurgical testing centers

8. Genel Bilişsel Yetenek Ölçümlerinde Süre ve Performans İlişkisinde A Tipi Kişiliğin Rolü(The Role of Type A Personality on the Relationship between Time and Performance in Measurement of General Cognitive Ability)

9. Effect of Material Type and Minimum Diameter of Specimens on the Fatigue Life

10. Novel Paradigm to Record Bilateral Click-Evoked Auditory Brainstem Responses Simultaneously (BiSi-ABR).

11. Weak D Testing is not Required for D- Patients With C-E- Phenotype.

12. Reliability and Its Quantitative Measures

13. STOCHASTIC OPTIMIZATION OF LABORATORY TEST WORKFLOW AT METALLURGICAL TESTING CENTERS.

14. A novel two-fold state skip logic Built-In Self-Test scheme for digital circuits.

15. Stirred-Mode Operation of Reverberation Chambers for EMC Testing.

16. Reliability and Its Quantitative Measures.

17. Experiments for the long-term prediction of creep strain of expanded polystyrene under compressive stress

18. Test Access Mechanism Optimization, Test Scheduling, and Tester Data Volume Reduction for System-on-Chip.

19. Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip.

20. Weak D Testing is not Required for D- Patients With C-E- Phenotype

21. Shortening testing time of a web-based business application in scrum using automated testing

22. Priming and testing silicon patch-clamp neurochips

23. An approach to Measure Transition Density of Binary Sequences for X-filling based Test Pattern Generator in Scan based Design

25. Weak D Testing is not Required for D- Patients With C-E- Phenotype.

26. Flight Testing and Real-Time System Identification Analysis of a UH-60A Black Hawk Helicopter with an Instrumented External Sling Load

27. Bezpečné aplikace s mikrokontroléry

28. Bezpečné aplikace s mikrokontroléry

29. Bezpečné aplikace s mikrokontroléry

30. Bezpečné aplikace s mikrokontroléry

31. Bezpečné aplikace s mikrokontroléry

32. Reliability and Its Quantitative Measures

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