1. Model for Prediction of Testing Time of a Computer Program for Automated Reliability Evaluation of Semiconductor Devices
- Author
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V. O. Kaziuchyts, S. M. Borovikov, and E. N. Shneiderov
- Subjects
computer programs ,testing efficiency ,testing time ,operational reliability ,semiconductor devices ,Electronics ,TK7800-8360 - Abstract
The KLASS computer program planned for development is designed to work as a part of the ARION-plus software package and allows you to perform an automated assessment of the reliability of electronic products, including semiconductor devices. At the stage of work planning on the creation of the KLASS program, as a module of the ARION-plus complex, the question arose about the working time allotted for the procedure for testing a computer program. The approaches described in the scientific literature used to assess the operational reliability of computer programs, taking into account their testing, proceed from the fact that the program code has been written and debugged and there are certain data on the results of testing the computer program. Software developers would like to know the predicted testing time, which ensures a given operational reliability of a computer program, even before starting work on writing program code. Based on the analysis of the experimental data on the reliability of computer programs in various fields of application, a model is proposed for determining the testing time required to ensure the operational reliability of programs. The model was used for the computer program KLASS planned for development and takes into account the programming language, the amount of program code, the speed of the computer processor, and the scope of the program. Based on the obtained model, a nomogram with two binary fields was constructed, which allows one to quickly determine the predicted time for testing computer programs.
- Published
- 2022
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