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The effects of miniaturization on theoretically predicted performance of dual-period guided mode resonance (GMR) transmission filters, which demonstrate immense potential for multispectral imaging in short wave infrared (SWIR), have been compared with experimental findings. With reducing filter size from 112 periods (90 µm) to 12 periods (10 µm), peak transmittance (Tpeak) of simulated and measured filters reduced gradually from 84% to 55% and from 76% to 65%, respectively, with a moderate change of 1 - 3 nm in full width at half maximum (FWHM). For 6 period filters (5 µm), simulations predict drastically reduced Tpeak = 14% accompanied by increase in FWHM by 12 nm. The Tpeak value is theoretically shown to increase to 46% with FWHM reduced by 7 nm upon placing metal reflectors at the optimum positions to increase the optical path length. Our findings indicate that four 5 µm × 5 µm size filters with metal reflectors designed for different resonance wavelengths can be used to form a single, 20 µm × 20 µm mosaic pixel for SWIR multispectral imaging.

Date of Conference: 1-6 February 2020 Conference Name: SPIE OPTO, 2020: Gallium Nitride Materials and Devices XV 2020 In this work, the effect of introducing a photonic crystal network of silicon nitride (SiN) micro-domes on the backside of silver coated gallium nitride (GaN) based light emitting diodes (LEDs) was studied. First, sapphire side of the top emitting LEDs, which is the bottom surface of the LEDs, is coated with silver (Ag). Light emitted towards the sapphire substrate is reflected upwards to the top surface and the amount of light extracted from the LED is expected to increase. In an alternative approach, SiN micro-domes forming a two dimensional photonic crystal, 2 μm in diameter and 80 nm in height in average, are deposited on the light emitting surface of the device with a period of 2 μm. Coating the backside with Ag has increased the efficiency of a top emitting LED by 11%. By introducing the SiN photonic crystal onto the Ag backside coated sample, total internal reflection is reduced via scattering and the amount of light emitted has been increased by 30% at 5·104 mA/cm2. Integration of SiN micro-domes with Ag coating has significantly impacted light extraction which has been shown to increase the efficiency of GaN based LEDs. Fabrication process and the results are discussed in detail.

WOS: 000430037600030, We investigate the effect of InGaN stress compensation layer on the properties of light emitting diodes based on InGaN/GaN multiple quantum well (MQW) structures with step graded electron injectors. Insertion of an InGaN stress compensation layer between n-GaN and the step graded electron injector provides, among others, strain reduction in the MQW region and as a result improves epitaxial quality that can be observed by 15-fold decrease of V-pit density. We observed more uniform distribution of In between quantum wells in MQW region from results of electro- and photoluminescence measurement. These structural improvements lead to increasing of radiant intensity by a factor of 1.7-2.0 and enhancement of LED efficiency by 40%. (C) 2018 Elsevier Ltd. All rights reserved., Scientific and Technological Research Council of Turkey [113G042]; TUBITAK, Financial support for this work is provided by the Scientific and Technological Research Council of Turkey (Grant No: 113G042). Ismail Altuntas acknowledges the Ph.D. Grant support from TUBITAK. We thank UNAM-National Nanotechnology Research Center at Bilkent University for access to fabrication and characterization equipment.

WOS: 000425566100069, Enhancement of InGaN/GaN based light emitting diode performance with step graded electron injectors through a two-step passivation is reported. Perimeter passivation of LED dies with SiO2 immediately following ICP mesa etch in addition to conventional Si3N4 dielectric surface passivation leads to decrease in the reverse bias leakage current by a factor of two as well as a decrease in the shunt current under forward bias by an order of magnitude. Mitigation of the leakage currents owing to the two-step passivation leads to significant increase in the radiant intensity of LEDs by more than a factor of two compared to the conventional single step surface passivation. Further, micro-dome patterned surface of Si3N4 passivation layer allow enhanced light extraction from LEDs. (C) 2017 Elsevier Ltd. All rights reserved., Scientific and Technological Research Council of Turkey (TUBITAK) [113G042]; TUBITAK, Financial support for this project was provided by the Scientific and Technological Research Council of Turkey (TUBITAK) [Grant No: 113G042]. Ismail Altuntas, acknowledges the Ph.D. Grant support from TUBITAK. We thank to UNAM-National Nanotechnology Research Center at Bilkent University for the use of fabrication and characterization equipment.

The atomic composition with less than 1–2 atom% uncertainty was measured in ternary BeZnO and quaternary BeMgZnO alloys using a combination of nondestructive Rutherford backscattering spectrometry with 1 MeV He+ analyzing ion beam and non-Rutherford elastic backscattering experiments with 2.53 MeV energy protons. An enhancement factor of 60 in the cross-section of Be for protons has been achieved to monitor Be atomic concentrations. Usually the quantitative analysis of BeZnO and BeMgZnO systems is challenging due to difficulties with appropriate experimental tools for the detection of the light Be element with satisfactory accuracy. As it is shown, our applied ion beam technique, supported with the detailed simulation of ion stopping, backscattering, and detection processes allows of quantitative depth profiling and compositional analysis of wurtzite BeZnO/ZnO/sapphire and BeMgZnO/ZnO/sapphire layer structures with low uncertainty for both Be and Mg. In addition, the excitonic bandgaps of the layers were deduced from optical transmittance measurements. To augment the measured compositions and bandgaps of BeO and MgO co-alloyed ZnO layers, hybrid density functional bandgap calculations were performed with varying the Be and Mg contents. The theoretical vs. experimental bandgaps show linear correlation in the entire bandgap range studied from 3.26 eV to 4.62 eV. The analytical method employed should help facilitate bandgap engineering for potential applications, such as solar blind UV photodetectors and heterostructures for UV emitters and intersubband devices.

WOS: 000415768800128, The effect of a transparent ITO current spreading layer on electrical and light output properties of blue InGaN/GaN light emitting diodes (LEDs) is discussed. When finite conductivity of ITO is taken into account, unlike in previous models, the topology of LED die and contacts are shown to significantly affect current spreading and light output characteristics in top emitting devices. We propose an approach for calculating the current transfer length describing current spreading. We show that an inter-digitated electrode configuration with distance between the contact pad and the edge of p-n junction equal to transfer length in the current spreading ITO layer allows one to increase the optical area of LED chip, as compared to the physical area of the die, light output power, and therefore, the LED efficiency for a given current density. A detailed study of unpassivated LEDs also shows that current transfer lengths longer than the distance between the contact pad and the edge of p-n junction leads to increasing surface leakage that can only be remedied with proper passivation. (C) 2017 Elsevier Ltd. All rights reserved., TUBITAK [113G042]; Scientific and Technological Research Council of Turkey (TUBITAK), This work has been performed with the support of TUBITAK (Grant no: 113G042). Ismail Altuntas, acknowledges the Ph.D. Grant support from the Scientific and Technological Research Council of Turkey (TUBITAK).

A wide range of optical bandgap modulation up to 5.1 eV was achieved for quaternary BeMgZnO thin films prepared using plasma assisted molecular beam epitaxy, enabling development of UV emitters and solar-blind photodetectors. The significantly improved structural quality and bandgap widening in BeMgZnO layers as compared to those of BeZnO and MgZnO ternaries indicate enhanced incorporation of both Be and Mg on Zn sites in the wurtzite lattice. Correlation of lattice parameters with optical bandgaps reveals that co-alloying MgO and BeO with ZnO helps overcome the impediment of limited bandgap extension offered by the corresponding ternary compounds due to phase separation and allows lattice-matched or nearly lattice-matched BeMgZnO/ZnO heterostructures. Optimization of growth conditions at higher Mg and/or Be fluxes is expected to provide bandgaps beyond 5.1 eV.

Spectroscopic ellipsometry is a prominent method for finding both the thickness and permittivity of unknown thin material films due to its sensitivity, flexibility, and self-referencing nature. For non-absorbing films, the thickness and permittivity can be readily retrieved due to an excess of data content, which produces a clearly defined best-fit for a series of test material parameters. However, in materials with absorption throughout the spectrum, there is often insufficient data content to uniquely characterize both film thickness and permittivity for the thin film material. This leads to a flat fit optimization curve that can produce apparently good fit results from a wide range of material parameters. To overcome this data content shortage, additional techniques are necessary to either increase the measured data content or reduce the unknown parameters and establish the unique material properties for the film. Here, we explore the use of spectroscopic ellipsometry combined with transmission intensity data and discuss the pitfalls of fitting such thin absorbing films. Specifically, we examine the case of titanium nitride, a rising refractory alternative plasmonic material and demonstrate that without proper ellipsometry fitting procedures, retrieved permittivity values can vary by a factor of three or more.

Point defects in high-purity GaN layers grown by hydride vapor phase epitaxy are studied by steady-state and time-resolved photoluminescence (PL). The electron-capture coefficients for defects responsible for the dominant defect-related PL bands in this material are found. The capture coefficients for all the defects, except for the green luminescence (GL1) band, are independent of temperature. The electron-capture coefficient for the GL1 band significantly changes with temperature because the GL1 band is caused by an internal transition in the related defect, involving an excited state acting as a giant trap for electrons. By using the determined electron-capture coefficients, the concentration of free electrons can be found at different temperatures by a contactless method. A new classification system is suggested for defect-related PL bands in undoped GaN.

The effect of delta-doping of In0.06Ga0.94N barriers with Mg on the quantum efficiency of blue light-emitting-diodes (LEDs) with active regions composed of 6 (hex) 3-nm In0.15Ga0.85N is investigated. Compared to the reference sample, delta-doping of the first barrier on the n-side of the LED structure improves the peak external quantum efficiency (EQE) by 20%, owing to the increased hole concentration in the wells adjacent to the n-side, as confirmed by numerical simulations of carrier distributions across the active region. Doping the second barrier, in addition to the first one, did not further enhance the EQE, which likely indicates compensation of improved hole injection by degradation of the active region quality due to Mg doping. Both LEDs with Mg delta-doped barriers effectively suppress the drop of efficiency at high injection when compared to the reference sample, and the onset of EQE peak roll-off shifts from similar to 80 A/cm(2) in the reference LED to similar to 120 A/cm(2) in the LEDs with Mg delta-doped barriers. (C) 2015 AIP Publishing LLC.

International audience; The optical properties of GaN/Al0.15Ga0.85N multiple quantum wells are examined in 8K–300K temperature range. Both polarized CW and time resolved temperature-dependent photoluminescence experiment are performed so that we can deduce the relative contributions of the non-radiative and radiative recombination processes. From the calculation of the proportion of the excitonic population having wave vector in the light cone, we can deduce the variation of the radiative decay time with temperature. We find part of the excitonic population to be localized in concert with the report of Corfdir et al. (Jpn. J. Appl. Phys., Part 2 52, 08JC01 (2013)) in case of a-plane quantum wells. VC 2014 AIP Publishing LLC.

BexMgyZn1−x−yO semiconductor solid solutions are attractive for UV optoelectronics and electronic devices owing to their wide bandgap and capability of lattice-matching to ZnO. In this work, a combined experimental and theoretical study of lattice parameters, bandgaps, and underlying electronic properties, such as changes in band edge wavefunctions in BexMgyZn1−x−yO thin films, is carried out. Theoretical ab initio calculations predicting structural and electronic properties for the whole compositional range of materials are compared with experimental measurements from samples grown by plasma assisted molecular beam epitaxy on (0001) sapphire substrates. The measured a and c lattice parameters for the quaternary alloys BexMgyZn1−x with x = 0−0.19 and y = 0–0.52 are within 1%–2% of those calculated using generalized gradient approximation to the density functional theory. Additionally, composition independent ternary BeZnO and MgZnO bowing parameters were determined for a and c lattice parameters and the b...

We report on detailed investigations of the electronic and magnetic properties of ferromagnetic GaMnAs layers, which have been fabricated by low-temperature molecular-beam epitaxy. Superconducting quantum interference device measurements reveal a decrease of the Curie temperature from the surface to the GaMnAs/GaAs interface. While high resolution x-ray diffraction clearly shows a homogeneous Mn distribution, a pronounced decrease of the carrier concentration from the surface towards the GaMnAs/GaAs interface has been found by Raman spectroscopy as well as electrochemical capacitance-voltage profiling. The gradient in Curie temperature seems to be a general feature of GaMnAs layers grown at low-temperature. Possible explanations are discussed.

We report on an enhancement of the Curie temperature in GaMnAs/InGaMnAs superlattices grown by low-temperature molecular beam epitaxy, which is due to thin InGaMnAs or InGaAs films embedded into the GaMnAs layers. The pronounced increase of the Curie temperature is strongly correlated to the In concentration in the embedded layers. Curie temperatures up to 110 K are observed in such structures compared to 60 K in GaMnAs single layers grown under the same conditions. A further increase in T$_C$ up to 130 K can be achieved using post-growth annealing at temperatures near the growth temperature. Pronounced thickness fringes in the high resolution X-ray diffraction spectra indicate good crystalline quality and sharp interfaces in the structures., Comment: 4 pages, 4 figures, submitted to Appl. Phys. Lett

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Si-doped GaN layers grown by metal organic vapor phase epitaxy on m-plane GaN substrates were investigated by low-temperature cathodoluminescence (CL). We have observed stacking fault (SF) related emission in the range of 3.29–3.42 eV for samples with moderate doping, while for the layers with high concentration of dopants, no CL lines related to SFs have been noted. Perturbation of the SF potential profile by neighboring impurity atoms can explain localization of excitons at SFs, while this effect would vanish at high doping levels due to screening.

AlGaN/GaN heterojunction field effect transistors (HFETs) with 2 μm gate length were subjected to on-state-high-field (high drain bias and drain current) and reverse-gate-bias (no drain current and reverse gate bias) stress at room and elevated temperatures for up to 10 h. The resulting degradation of the HFETs was studied by direct current and uniquely phase noise before and after stress. A series of drain and gate voltages was applied during the on-state-high-field and reverse-gate-bias stress conditions, respectively, to examine the effect of electric field on degradation of the HFET devices passivated with SiNx. The degradation behaviors under these two types of stress conditions were analyzed and compared. In order to isolate the effect of self-heating/temperature on device degradation, stress experiments were conducted at base plate temperatures up to 150 °C. It was found that the electric field induced by reverse-gate-bias mainly generated trap(s), most likely in the AlGaN barrier, which initially were manifested as generation-recombination (G-R) peak(s) in the phase noise spectra near 103 Hz. Meanwhile electric field induced by on-state-high-field stress mainly generated hot-electron and hot-phonon effects, which result in a nearly frequency independent increase of noise spectra. The external base plate temperatures promote trap generation as evidenced by increased G-R peak intensities.

We report microstructural characterization of heavily Ga-doped ZnO (GZO) thin films on GaN and sapphire by aberration-corrected scanning transmission electron microscopy. Growth under oxygen-rich and metal-rich growth conditions leads to changes in the GZO polarity and different extended defects. For GZO layers on sapphire, the primary extended defects are voids, inversion domain boundaries, and low-angle grain boundaries. Ga doping of ZnO grown under metal-rich conditions causes a switch from pure oxygen polarity to mixed oxygen and zinc polarity in small domains. Electron energy loss spectroscopy and energy dispersive spectroscopy spectrum imaging show that Ga is homogeneous, but other residual impurities tend to accumulate at the GZO surface and at extended defects. GZO grown on GaN on c-plane sapphire has Zn polarity and no voids. There are misfit dislocations at the interfaces between GZO and an undoped ZnO buffer layer and at the buffer/GaN interface. Low-angle grain boundaries are the only threadin...

We report on the mechanisms governing electron transport using a comprehensive set of ZnO layers heavily doped with Ga (GZO) grown by plasma-enhanced molecular-beam epitaxy on a-plane sapphire substrates with varying oxygen-to-metal ratios and Ga fluxes. The analyses were conducted by temperature dependent Hall measurements which were supported by microstructural investigations as well. Highly degenerate GZO layers with n > 5 × 1020 cm−3 grown under metal-rich conditions (reactive oxygen-to-metal ratio

We report on cathodoluminescence (CL) and transmission electron microscopy (TEM) studies of m-plane Mg-doped GaN layers grown by metal-organic vapor phase epitaxy (MOVPE). The layers contain basal plane and prismatic stacking faults (SFs) with a density of ~106 cm-1. Broad emission peaks commonly ascribed to SF were found to be insignificant in these samples. However, a set of quite strong and sharp lines were detected in the same spectral region 3.36-3.42 eV. The observed peaks are tentatively explained as excitons bound to some point defects by analogy with p-type GaAs, since donor-acceptor pair (DAP) recombination was ruled out by the CL mapping experiments. funding agencies|Swedish Energy Agency||Swedish Research Council (VR) Linnaeus Environment LiLi-NFM at Linkoping||Carl Trygger Foundation||Swedish Governmental Agency for Innovation Systems (VINNOVA)||National Science Foundation, Division of Materials Research

The relative roles of radiative and nonradiative processes and the polarization field on the light emission from blue (∼425 nm) InGaN light emitting diodes (LEDs) have been studied. Single and multiple double heterostructure (DH) designs have been investigated with multiple DH structures showing improved efficiencies. Experimental results supported by numerical simulations of injection dependent electron and hole wavefunction overlap and the corresponding radiative recombination coefficients suggest that increasing the effective active region thickness by employing multiple InGaN DH structures separated by thin and low barriers is promising for LEDs with high efficiency retention at high injection. The use of thin and low barriers is crucial to enhance carrier transport across the active region. Although increasing the single DH thickness from 3 to 6 nm improves the peak external quantum efficiency (EQE) by nearly 3.6 times due to increased density of states and increased emitting volume, the internal quantum efficiency (IQE) suffers a loss of nearly 30%. A further increase in the DH thickness to 9 and 11 nm results in a significantly slower rate of increase of EQE with current injection and lower peak EQE values presumably due to degradation of the InGaN material quality and reduced electron-hole spatial overlap. Increasing the number of 3 nm DH active regions separated by thin (3 nm) In0.06Ga0.94N barriers improves EQE, while maintaining high IQE (above 95% at a carrier concentration of 1018 cm−3) and showing negligible EQE degradation up to 550 A/cm2 in 400 × 400 μm2 devices due to increased emitting volume and high radiative recombination coefficients and high IQE. Time-resolved photoluminescence measurements revealed higher radiative recombination rates with increasing excitation due to screening of the internal field and enhanced electron and hole overlap at higher injection levels. To shed light on the experimental observations, the effect of free-carrier screening on the polarization field at different injection levels and the resulting impact on the quantum efficiency were investigated by numerical simulations.

We report a void defect in gallium nitride (GaN) and InGaN, revealed by aberration-corrected scanning transmission electron microscopy (STEM). The voids are pyramids with symmetric hexagonal {0001} base facets and {101¯1} side facets. Each pyramid void has a dislocation at the peak of the pyramid, which continues up along the [0001] growth direction to the surface. Some of the dislocations are hexagonal open core screw dislocations with {101¯0} side facets, varying lateral widths, and varying degrees of hexagonal symmetry. STEM electron energy loss spectroscopy spectrum imaging showed a large C concentration inside the void and on the void surfaces. There is also a larger C concentration in the GaN (or InGaN) below the void than above the void. We propose that inadvertent carbon deposition during metal organic chemical vapor deposition growth acts as a mask, stopping the GaN deposition locally, which in combination with lateral overgrowth, creates a void. Subsequent layers of GaN deposited around the C co...

Ferroelectric material Ba0.5Sr0.5TiO3 has been grown on a polycrystalline ferrite yttrium iron garnet (YIG) substrate to achieve independent tuning of permittivity and permeability through the electric and magnetic field, respectively. A large dielectric constant and dielectric-constant tuning of the BST layer has been achieved with a simple deposition procedure by RF magnetron sputtering. Coplanar waveguides were fabricated on the bilayer structure to demonstrate the benefits of additional permeability tuning by external applied magnetic field: (i) to alleviate the impedance-mismatch caused by electric-field tuning of permittivity; (ii) to improve differential phase shift. A large differential phase shift of 77°/cm at 5 GHz for an applied electric field of 60 kV/cm has been achieved with the aid of the magnetic field.

Fluctuation technique is used to measure hot-phonon lifetime in dual channel GaN-based configuration proposed to support high-power operation at high frequencies. The channel is formed of a composite Al0.1Ga0.9N/GaN structure situated in an Al0.82In0.18N/AlN/Al0.1Ga0.9N/GaN heterostructure. According to capacitance–voltage measurements and simultaneous treatment of Schrodinger–Poisson equations, the mobile electrons in this dual channel configuration form a camelback density profile at elevated hot-electron temperatures. The hot-phonon lifetime was found to depend on the shape of the electron profile rather than solely on its sheet density. The camelback channel with an electron sheet density of 1.8 × 1013 cm−2 demonstrates ultrafast decay of hot phonons at hot-electron temperatures above 600 K: the hot-phonon lifetime is below ∼60 fs in contrast to ∼600 fs at an electron sheet density of 1.2 × 1013 cm−2 obtained in a reference Al0.82In0.18N/AlN/GaN structure at 600 K. The results suggest a suitable method to increase the electron sheet density without the deleterious effect caused by inefficient hot-phonon decay observed in a standard design at similar electron densities.

We report on the tuning of permittivity and permeability of a ferroelectric/ferromagnetic bilayer structure which can be used as a microwave phase shifter with two degrees of tuning freedom. The structure was prepared by the growth of a yttrium iron garnet (YIG) layer on a gadolinium gallium garnet substrate by liquid phase epitaxy, the growth of a barium strontium titanate (BST) layer on the YIG layer through pulsed laser deposition, and then the fabrication of a coplanar waveguide on the top of BST through e-beam evaporation and trilayer liftoff techniques. The phase shifters exhibit a differential phase shift of 38°/cm at 6 GHz through permittivity tuning under an applied electric field of ∼75 kV/cm and a static magnetic field of 1700 Oe. By tuning the permeability through the applied magnetic field we increase the differential phase shift to 52°/cm and simultaneously obtain a better match to the zero applied electric field condition, resulting in an improvement in the return loss from 22.4 to 24.9 dB....

Dielectric properties of annealed and as-grown ferroelectric Ba0.5Sr0.5TiO3 (BST) grown by pulsed laser deposition on sputtered BST seed layers on strontium titanate (STO) substrates were investigated at microwave frequencies in the realm of tunability of its dielectric constant as well as phase shifters based on this material. The as-grown layers were nearly fully relaxed with measured lattice parameters nearly identical to those of bulk BST. The tuning of the relative dielectric constant (∼1750 at zero bias at 10 GHz) of the annealed BST was found to be as high as 59% and 56% at 10 and 19 GHz, respectively. The analysis of the loss in the BST results in a measured tan δ of 0.02 for the annealed as well as the unannealed films at a frequency of 18 GHz. Phase shifters also exhibited high tuning with differential phase shift figures of merit of 35 and 55°/dB at a field of 60 kV/cm at 10 and 19 GHz, respectively. Serendipitously, most of the tuning occurs at low fields, and thus we propose a new figure of m...