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This paper presents a theoretical analysis of an nBp infrared barrier detector's performance intended to operate at a room temperature (300 K) based on AIIIBV materials—In1-xGaxAsySb1−y quaternary compound—lattice-matched to the GaSb substrate with a p-n heterojunction ternary Al1−xGaxSb barrier. Numerical simulations were performed using a commercial Crosslight Software—package APSYS. The band structure of the nBp detector and the electric field distribution for the p-n heterojunction with and without a potential barrier were determined. The influence of the barrier-doping level on the detector parameters was analyzed. It was shown that Shockley-Read-Hall (SRH) recombination plays a decisive role in carrier transport for lifetimes shorter than 100 ns. The influence of the absorber/barrier thickness on the detector's dark current density and photocurrent was investigated. It was shown that valence band offset does not influence the device's performance. The quantum efficiency reaches its maximum value for an absorber's thickness of ~3 μm. The performed simulations confirmed the possibility of the detector's fabrication exhibiting high performance at room temperature based on quaternary compounds of AIIIBV materials for the short wavelength infrared range. [ABSTRACT FROM AUTHOR]

The performance of long-wave infrared (LWIR) = 0.22 HgCdTe avalanche photodiodes (APDs) was presented. The dark currentvoltage characteristics at temperatures 200 K, 230 K, and 300 K were measured and numerically simulated. Theoretical modeling was performed by the numerical Apsys platform (Crosslight). The effects of the tunneling currents and impact ionization in HgCdTe APDs were calculated. Dark currents exhibit peculiar features which were observed experimentally. The proper agreement between the theoretical and experimental characteristics allowed the determination that the material parameters of the absorber were reached. The effect of the multiplication layer profile on the detector characteristics was observed but was found to be insignificant. [ABSTRACT FROM AUTHOR]

The paper reports on a long-wave infrared (cut-off wavelength ~ 9 μm) HgCdTe detector operating under nbiased condition and room temperature (300 K) for both short response time and high detectivity operation. The ptimal structure in terms of the response time and detectivity versus device architecture was shown. The response time of the long-wave (active layer Cd composition, xCd = 0.19) HgCdTe detector for 300 K was calculated at a level of τs ~ 1 ns for zero bias condition, while the detectivity − at a level of D* ~ 109 cmHz1/2/W assuming immersion. It was presented that parameters of the active layer and P+ barrier layer play a critical role in order to reach τs ≤ 1 ns. An extra series resistance related to the processing (RS+ in a range 5−10 Ω) increased the response time more than two times (τs ~ 2.3 ns).

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The paper reports on a long-wave infrared (cut-off wavelength ~ 9 µm) HgCdTe detector operating under unbiased condition and room temperature (300 K) for both short response time and high detectivity operation. The optimal structure in terms of the response time and detectivity versus device architecture was shown. The response time of the long-wave (active layer Cd composition, xcd = 0.19) HgCdTe detector for 300 K was calculated at a level of τs ~ 1 ns for zero bias condition, while the detectivity - at a level of D* ~ 109 cmHz1/2/W assuming immersion. It was presented that parameters of the active layer and P+ barrier layer play a critical role in order to reach τs ≤ 1 ns. An extra series resistance related to the processing (Rs+ in a range 5-10 Ω) increased the response time more than two times (τs ~ 2.3 ns). [ABSTRACT FROM AUTHOR]