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Your search keyword '"Metzger, T.H"' showing total 6 results
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6 results on '"Metzger, T.H"'

3. Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayers

Author

Vitta, Satish, Metzger, T.H., and Peisl, J.

Subjects
X-rays -- Research, X-ray microscope -- Research, Reflectance -- Research, Astronomy, Physics
Abstract

Multilayers for the water window region of the soft x rays have been prepared by pulsed laser ablation with amorphous [Ni.sub.50][Nb.sub.50] and amorphous C. The structural characterization of the multilayers, period d = 2.41 nm, shows that the interfaces are sharp with a roughness of only 0.4 nm that is chemical, not morphological, in origin. The interface roughness was found to be uncorrelated in the direction normal to the plane of the film. The normal incidence soft-x-ray reflectivity of the multilayer at 4.85-nm wavelength is 0.06%, 1 order of magnitude lower than the theoretically predicted value. However, the resolution limit [Lambda]/[Delta][Lambda] of the multilayer was found to be 16.7, close to the theoretically predicted value. Key words: Soft x rays, multilayers, x-ray microscopy.

Published
1997

4. Ordered micro/mesoporous composite prepared as thin films

Author

Petkov, N., Holzl, M., Metzger, T.H., Mintova, S., and Bein, T.

Subjects
Chemistry, Physical and theoretical -- Research, Silica -- Chemical properties, Zeolites -- Chemical properties, Dielectric films -- Research, Thin films -- Research, Chemicals, plastics and rubber industries
Abstract

A new synthesis method for preparation of thin films and powders consisting of zeolite beta nanocrystals embedded in ordered mesoporous silica matrix is described. It is shown that the incorporation of beta nanocrystals in the mesoporous silica matrix and the mesophase order itself can be controlled through the variation of the fractional amounts of the zeolite nanoparticles and silica/surfactant solutions.

Published
2005

5. In-line holography and coherent diffractive imaging with x-ray waveguides

Author

De Caro L., Giannini C., Pelliccia D., Mocuta C., Metzger T.H., Guagliardi A., Cedola A., Burkeeva I., and Lagomarsino S.

Subjects
Physics::Optics
Abstract

A Fresnel coherent diffraction imaging experiment with hard x rays is here presented, using two planar crossed waveguides as optical elements, leading to a virtual pointlike source. The coherent wave field obtained with this setup is used to illuminate a micrometric single object having the shape of a butterfly. A digital two-dimensional in-line holographic reconstruction of the unknown object at low resolution 200 nm has been obtained directly via fast Fourier transform FFT of the raw data. The object and its twin image are well separated because suitable geometrical conditions are satisfied. A good estimate of the incident wave field phase has been extracted directly from the FFT of the raw data. A partial object reconstruction with 50 nm spatial resolution was achieved by fast iterative phase retrieval, the major limitation for a full reconstruction being the nonideal structure of the guided beam. The method offers a route for fast and reliable phase retrieval in x-ray coherent diffraction.

Published
2008

6. Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Author

Favre-Nicolin, V., Mastropietro, F., Eymery, J., Camacho, D., Niquet, Y.M., Borg, B.M., Messing, M.E., Wernersson, L.-E., Algra, R.E., Bakkers, E.P.A.M., Metzger, T.H., Harder, R., Robinson, I.K., Favre-Nicolin, V., Mastropietro, F., Eymery, J., Camacho, D., Niquet, Y.M., Borg, B.M., Messing, M.E., Wernersson, L.-E., Algra, R.E., Bakkers, E.P.A.M., Metzger, T.H., Harder, R., and Robinson, I.K.

Abstract

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation. © IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. U7 - Export Date: 2 August 2010 U7 - Source: Scopus U7 - Art. No.: 035013

Published
2010

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