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The angular motion of quasi-static micromirrors used for raster scanning projection applications is typically affected by undesired oscillations related to high-frequency resonant modes triggered by the sawtooth-like driving signal. This paper proposes a novel closed-loop tracking controller for improving the linearity of the trace motion, and hence the image brightness. It includes a feedforward action to achieve the required tracking performance under nominal conditions, and a feedback control for robustness against disturbances and other nonidealities. Notch filtering prevents resonance-induced ringing. The simplicity of the architecture enables an easy implementation on FPGA or ASIC. Experimental tests carried out on two different micromirrors with Lead-Zirconate-Titanate (PZT) piezoelectric actuation and piezoresistive sensing demonstrate an average linearity of [Formula: see text] and reproducibility of [Formula: see text] for sawtooth reference trajectories with up to [Formula: see text] amplitude and 120 Hz frequency, thus meeting the performance requirements mandated by the standards for high-resolutions projection applications.

We have developed a manufacturing process for micromirrors based on microelectromechanical systems (MEMS) technology. The process involves designing an electrostatic vertically comb-driven actuator and utilizing a self-alignment process to produce a height difference between the movable comb structure and the fixed comb structure of the micromirror. To improve the stability of the micromirror, we propose four instability models in micromirror operation with the quasi-static driving principle and structure of the micromirror considered, which can provide a basic guarantee for the performance of vertical comb actuators. This analysis pinpoints factors leading to instability, including the left and right gap of the movable comb, the torsion beams of the micromirror, and the comb-to-beams distance. Ultimately, the voltages at which device failure occurs can be determined. We successfully fabricated a one-dimensional micromirror featuring a 0.8 mm mirror diameter and a 30 μm device layer thickness. The height difference between the movable and fixed comb structures was 10 μm. The micromirror was able to achieve a static mechanical angle of 2.25° with 60 V@DC. Stable operation was observed at voltages below 60 V, in close agreement with the theoretical calculations and simulations. At the driving voltage of 80 V, we observed the longitudinal displacement movement of the comb fingers. Furthermore, at a voltage of 129 V, comb adhesion occurred, resulting in device failure. This failure voltage corresponds to the lateral torsional failure voltage. [ABSTRACT FROM AUTHOR]

We have developed a manufacturing process for micromirrors based on microelectromechanical systems (MEMS) technology. The process involves designing an electrostatic vertically comb-driven actuator and utilizing a self-alignment process to produce a height difference between the movable comb structure and the fixed comb structure of the micromirror. To improve the stability of the micromirror, we propose four instability models in micromirror operation with the quasi-static driving principle and structure of the micromirror considered, which can provide a basic guarantee for the performance of vertical comb actuators. This analysis pinpoints factors leading to instability, including the left and right gap of the movable comb, the torsion beams of the micromirror, and the comb-to-beams distance. Ultimately, the voltages at which device failure occurs can be determined. We successfully fabricated a one-dimensional micromirror featuring a 0.8 mm mirror diameter and a 30 μm device layer thickness. The height difference between the movable and fixed comb structures was 10 μm. The micromirror was able to achieve a static mechanical angle of 2.25° with 60 V@DC. Stable operation was observed at voltages below 60 V, in close agreement with the theoretical calculations and simulations. At the driving voltage of 80 V, we observed the longitudinal displacement movement of the comb fingers. Furthermore, at a voltage of 129 V, comb adhesion occurred, resulting in device failure. This failure voltage corresponds to the lateral torsional failure voltage.