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JoungKyongLee*,JongDukKim ** ,HyunJinLee** ,GyeongHeopJeon** ,JongGeunKim *,SungSeo*,MinWoongJung*,JinHyukChoi*,NamChulJo*,HyungSooPark*,WonHoKim * andYoungChulLim *ABSTRACTThe barley(Hordeumvulgare L.) is now widely grown as a whole crop silage in Korea, but the qualityof that silage does not examined from farms. Therefore, this experiment was conducted to evaluate theforage quality of whole crop barley that was participated in Silage Quality Contest in 2008. These datawere classified by region, dry matter(DM) yield, with or not additive, planting and harvest date.Difference on the lactic acid content of barley silage was detected in the region, DM yield, additive andharvest date(p

This study was conducted to find out an alternative way of rapid and accurate analysis of forage quality. Near reflectance infrared spectroscopy (NIRS) was used to evaluate the possibility of forage analysis and collect 258 samples such as barley for whole crop silage, forage corn and sudangrass from 2002 to 2007. The samples were analyzed for CP (crude protein), CF (crude fiber), ADF (acid detergent fiber), NDF (neutral detergent fiber) and IVTD (in vitro true digestibility), and also scanned using NIRSystem with wavelength from . Multiple linear regression was used with wet analysis data for developing the calibration model and validate unknown samples. The important index In this experiment was SEC and SEP for CF, CP, NDF, ADF and IVTD in calibration set were 0.70, 0.86, 0.94, 0.94 and 0.89, also 0.47, 0.39, 0.89, 0.90 and 0.61 in validation sample, respectively. The results of this experiment indicates that NIRS was reliable analytical method to assess forage quality, specially in CF, ADF and IVTD, sample should be included for respective forage samples to get accurate result. More robust calibrations can be made to cover every forage samples if added representative sample set.

This paper reviews silicon nanofabrication processes using atomic force microscopy (AFM). In particular, it summarizes recent results obtained in our research group regarding AFM-based silicon nanofabrication through mechanochemical local oxidation by diamond tip sliding, as well as mechanical, electrical, and electromechanical processing using an electrically conductive diamond tip. Microscopic three-dimensional manufacturing mainly relies on etching, deposition, and lithography. Therefore, a special emphasis was placed on nanomechanical processes, mechanochemical reaction by potassium hydroxide solution etching, and mechanical and electrical approaches. Several important surface characterization techniques consisting of scanning tunneling microscopy and related techniques, such as scanning probe microscopy and AFM, were also discussed.