1. Characterization and modeling of 650V GaN diodes for high frequency power conversion
- Author
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Defrance Nicolas, Yvon Arnaud, Idir Nadir, Doublet Martin, Okada Etienne, Duquesne Thierry, Pace Loris, Collard Emmanuel, De-Jaeger Jean-Claude, Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Puissance - IEMN (PUISSANCE - IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Plateforme de Caractérisation Multi-Physiques - IEMN (PCMP - IEMN), This work was supported by IPCEI French Nano2022 program., PCMP CHOP, Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 (L2EP), Centrale Lille-Université de Lille-Arts et Métiers Sciences et Technologies, HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-JUNIA (JUNIA), STMicroelectronics [Tours] (ST-TOURS), and Laboratoire commun STMicroelectronics-IEMN T1
- Subjects
Materials science ,diode ,model ,Frequency band ,business.industry ,s-parameters ,Gallium nitride ,High-electron-mobility transistor ,7. Clean energy ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,chemistry.chemical_compound ,chemistry ,Scattering parameters ,Silicon carbide ,Equivalent circuit ,Optoelectronics ,power converter ,Power semiconductor device ,characterization ,gallium nitride (GaN) ,business ,Diode - Abstract
POSTER 6; International audience; The constant growth of electric consumption leads to considerable progress in power conversion. Recent studies have shown that using Gallium Nitride (GaN) as a technological building bloc permits to develop converter operating at high frequency with reduced volume and weight. Furthermore, it is conceivable the monolithic co-integration of devices towards full-GaN switching cells. Therefore, characterization of GaN power devices is needed to provide accurate models in a wide frequency band in order to design new generations of converters. An innovative modeling method for GaN High Electron Mobility Transistor (HEMT) power transistors based on the use of Scattering parameters (Sparameters) and small-signal equivalent circuit was recently developed and validated in previous studies. Meanwhile, the demand concerning GaN diodes increases, pushing forward the need for dedicated electric model. Through S-parameters, current-voltage and current-collapse measurements, this paper presents the characterization of packaged GaN diodes with the aim to establish an accurate nonlinear model. The analyzed devices are still in the development phase, but initial results are very promising and get close to commercial SiC diodes available on the market.
- Published
- 2021