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29 results on '"C Kisielowski"'

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4. Detecting structural variances of Co

5. A HRTEM study of metastable phase formation in Al–Mg–Cu alloys during artificial aging

6. Atomic Resolution at 50 - 300 kV Obtained using Low Dose Rate HRTEM

7. Benefits of microscopy with super resolution

8. Metallic impurities in gallium nitride grown by molecular beam epitaxy

9. Authors' Response

10. Lighting With GaN: How Can HREM Help To Understand The Iii-Nitride System?

13. Single Electron Self-coherence and Its Wave/Particle Duality in the Electron Microscope.

14. Probing the Boundary between Classical and Quantum Mechanics by Analyzing the Energy Dependence of Single-Electron Scattering Events at the Nanoscale.

15. Tautomerism unveils a self-inhibition mechanism of crystallization.

16. Probing atom dynamics of excited Co-Mo-S nanocrystals in 3D.

17. Detecting structural variances of Co 3 O 4 catalysts by controlling beam-induced sample alterations in the vacuum of a transmission electron microscope.

18. Prospects for atomic resolution in-line holography for a 3D determination of atomic structures from single projections.

19. In-line three-dimensional holography of nanocrystalline objects at atomic resolution.

20. Atomically perfect torn graphene edges and their reversible reconstruction.

21. Atomic resolution phase contrast imaging and in-line holography using variable voltage and dose rate.

22. Observation of transient structural-transformation dynamics in a Cu2S nanorod.

23. Observation of single colloidal platinum nanocrystal growth trajectories.

24. Graphene at the edge: stability and dynamics.

25. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit.

26. A transmission electron microscopy study of mineralization in age-induced transparent dentin.

27. Bicrystalline hematite nanowires.

28. Interface structure and atomic bonding characteristics in silicon nitride ceramics.

29. Thin dielectric film thickness determination by advanced transmission electron microscopy.

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