1. Imaging the in-plane distribution of helium precipitates at a Cu/V interface.
- Author
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Chen, Di, Li, Nan, Yuryev, Dina, Wen, Juan, Baldwin, Kevin, Demkowicz, Michael J., and Wang, Yongqiang
- Subjects
HELIUM ,MICROSCOPY ,NOBLE gases ,OPTICS ,CHEMICALS - Abstract
We describe a transmission electron microscopy investigation of the distribution of helium precipitates within the plane of an interface between Cu and V. Statistical analysis of precipitate locations reveals a weak tendency for interfacial precipitates to align along ⟨110⟩-type crystallographic directions within the Cu layer. Comparison of these findings with helium-free Cu/V interfaces suggests that the precipitates may be aggregating preferentially along atomic-size steps in the interface created by threading dislocations in the Cu layer. Our observations also suggest that some precipitates may be aggregating along intersections between interfacial misfit dislocations. IMPACT STATEMENT Theinnovationof this paper is providing the first plane-view experimental images of in-plane helium precipitate distributions at an interface between physical vapor deposited face-centered cubic (fcc) and body-centered cubic (bcc) metals. [ABSTRACT FROM PUBLISHER]
- Published
- 2017
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