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Abstract: Source size broadening is an important resolution limiting effect in modern STEM experiments. Here, we propose an alternative method to measure the source size broadening making use of a holographic biprism to create interference patterns in an ‘empty’ Ronchigram. This allows us to measure the exact shape of the source size broadening with a much better sampling than previously possible. We find that the shape of the demagnified source deviates considerably from a Gaussian profile that is often assumed. We fit the profile with a linear combination of a Gaussian and a bivariate Cauchy distribution showing that even though the full width at half maximum is similar to previously reported measurements, the tails of the profile are considerable wider. This is of fundamental importance for quantitative comparison of STEM simulations with experiments as these tails make the image contrast dependent on the interatomic distance, an effect that cannot be reproduced by a single Gaussian profile of fixed width alone. [Copyright &y& Elsevier]

Abstract: It has often been stated that a holographic biprism represents a near perfect energy filter and only elastically scattered electrons can participate in the interference fringes. This is based on the assumption that the reference wave does not contain inelastically scattered electrons. In this letter we show that this is not exactly true because of the delocalised inelastic interaction of the reference wave with the sample. We experimentally and theoretically show that inelastic scattering plays a role in the fringe formation, but it is shown that this contribution is small and can usually be neglected in practice. [Copyright &y& Elsevier]

Abstract: Inelastic image simulation software is presented, implementing the double channeling approximation which takes into account the combination of multiple elastic and single inelastic scattering in a crystal. The approach is described with a density matrix formalism. Two applications in high resolution energy filtered (EFTEM) transmission electron microscopy (TEM) images are presented: thickness-defocus maps for and exit plane intensities for an multilayer system. Both systems show a severe breakdown in direct interpretability which becomes worse for higher acceleration voltages, thicker samples and lower excitation edge energies. Since this effect already occurs in the exit plane intensity, it is a fundamental limit and image simulations in EFTEM are indispensable just as they are indispensable for elastic high resolution TEM images. [Copyright &y& Elsevier]

Abstract: We discuss diffraction holography in a scattering geometry reported by Herring [Ultramicroscopy 104 (2005) 261, Ultramicroscopy 106 (2006) 960] and interpreted in terms of the density matrix of the fast electrons. Whereas the previous description used an approximation replacing the LACBED by a CBED geometry and consequently left some doubts about the conclusions (namely the non-detectability of the MDFF) we now fully include the Fresnel propagator and the biprism operator in order to calculate the density matrix of the inelastically scattered electrons in LACBED geometry. We show that a defocus on the biprism with respect to the sample does not cause a significant effect on the fringe patterns that are formed when the discs are exactly overlapping. An important difference to the CBED geometry is however that the fringe contrast decreases when the shear deviates from a reciprocal lattice vector. This should enable to measure the spatial coherence for smaller shears than is possible in image holography. [Copyright &y& Elsevier]

Abstract: We present energy filtered holography experiments on a thin foil of Al. By propagating the reduced density matrix of the probe electron through the microscope, we quantitatively predict the fringe contrast as a function of energy loss. Fringe contrast simulations include the effect of Fresnel fringes created at the edges of the defocused biprism, the effect of partial coherence in combination with inelastic scattering, and the effect of a finite energy distribution of the incoming beam. [Copyright &y& Elsevier]