392 results on '"Asenov, Asen"'
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2. Study of gate current in advanced MOS architectures
3. Statistical device simulations of III-V nanowire resonant tunneling diodes as physical unclonable functions source
4. How I do it: modified Lichtenberger-Brown tracheoesophageal puncture procedure
5. To make a coffee by bicycle riding: achieving sustainable development in higher education institutions step by step.
6. Stability and [formula omitted] analysis of ferroelectric negative capacitance FinFET based SRAM in the presence of variability
7. TCAD simulations and accurate extraction of reliability-aware statistical compact models
8. Stochastic analysis of surface roughness models in quantum wires
9. Investigation of inversion, accumulation and junctionless mode bulk Germanium FinFETs
10. Impact of quantum confinement on transport and the electrostatic driven performance of silicon nanowire transistors at the scaling limit
11. New floristic records in the Balkans: 52.
12. Justification of the need to implement intelligent warehouse systems in fish processing
13. STUDY OF INLAND WATERWAY TRANSPORT ROUTING OPTIONS UNDER CONDITIONS OF UNCERTAINTY IN NAVIGATIONAL RESTRICTIONS.
14. Where Do the Dopants Go?
15. Drain bias effects on statistical variability and reliability and related subthreshold variability in 20-nm bulk planar MOSFETs
16. Comprehensive study of the statistical variability in a 22 nm fully depleted ultra-thin-body SOI MOSFET
17. RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study
18. Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study
19. Accurate capturing of the statistical aspect of NBTI/PBTI variability into statistical compact models
20. Design and fabrication of memory devices based on nanoscale polyoxometalate clusters
21. Enabling Cutting-Edge Semiconductor Simulation through Grid Technology
22. Design and analysis of the [formula omitted]As implant-free quantum-well device structure
23. Simulation of hole-mobility in doped relaxed and strained Ge
24. Numerical analysis of the new Implant-Free Quantum-Well CMOS: DualLogic approach
25. From atoms to product reliability: toward a generalized multiscale simulation approach
26. Effect of a Discontinuous Ag Layer on Optical and Electrical Properties of ZnO/Ag/ZnOStructures.
27. PREDICTION OF FINE PARTICULATE MATTER IN LOW-EMISSION ZONES USING A MODIFIED NUMERICAL METHOD FOR A SYSTEM OF ORDINARY DIFFERENTIAL EQUATIONS.
28. The evolution of standard cell libraries for future technology nodes
29. Use of density gradient quantum corrections in the simulation of statistical variability in MOSFETs
30. Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques
31. Analysis of threshold voltage distribution due to random dopants: a 100000-sample 3-D simulation study
32. Current variability in Si nanowire MOSFETs due to random dopants in the source/drain regions: a fully 3-D NEGF simulation study
33. Surface roughness induced device variability: 3D ab initio Monte Carlo simulation study
34. Capacitance fluctuations in bulk MOSFETs due to random discrete dopants
35. Capacitance variability of short range interconnects
36. Boundary conditions for Density Gradient corrections in 3D Monte Carlo simulations
37. Severe Acute Myocarditis after the Third (Booster) Dose of mRNA COVID-19 Vaccination.
38. Random-dopant-induced drain current variation in nano-MOSFETs: a three-dimensional self-consistent Monte Carlo simulation study using 'ab-initio' ionized impurity scattering
39. Benchmarking of scaled InGaAs implant-free nanoMOSFETs
40. Intrinsic parameter fluctuations due to random grain orientations in high-κ gate stacks
41. Poly-Si-gate-related variability in decananometer MOSFETs with conventional architecture
42. A self-consistent full 3-D real-space NEGF simulator for studying nonperturbative effects in Nano-MOSFETs
43. Simulation study of individual and combined sources of intrinsic parameter fluctuations in conventional nano-MOSFETs
44. Random Telegraph Noise in 30 nm FETs with Conventional and High-κ Dielectrics
45. Intrinsic Parameter Fluctuations in Conventional MOSFETs at the Scaling Limit: A Statistical Study
46. Quantum Aspects of Resolving Discrete Charges in ‘Atomistic’ Device Simulations
47. Mobility Variations in Ultra Small Devices due to Random Discrete Dopants
48. Study of RF Linearity in sub-50 nm MOSFETs Using Simulations
49. On the Breakdown of Universal Mobility Curves: A Brownian 3D Simulation Framework
50. A 3-D Atomistic Study of Archetypal Double Gate MOSFET Structures
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