Author: "Asensio, Maria-Carmen" / Publisher: wiley-blackwell - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Asensio, Maria-Carmen" Publisher wiley-blackwell

Author: Giménez‐Marqués, Mónica, Bellido, Elena, Berthelot, Thomas, Simón‐Yarza, Teresa, Hidalgo, Tania, Simón‐Vázquez, Rosana, González‐Fernández, África, Avila, José, Asensio, Maria Carmen, Gref, Ruxandra, Couvreur, Patrick, Serre, Christian, and Horcajada, Patricia
Published: 2018
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Author: Marsden, Alexander J., Asensio, Maria‐Carmen, Avila, José, Dudin, Pavel, Barinov, Alexei, Moras, Paolo, Sheverdyaeva, Polina M., White, Thomas W., Maskery, Ian, Costantini, Giovanni, Wilson, Neil R., and Bell, Gavin R.
Subjects: *PHOTOELECTRON spectroscopy, *X-ray spectroscopy, *GRAPHENE, *COPPER foil, *LOW energy electron diffraction, *FERMI level
Abstract: Angle-resolved photoemission spectroscopy (ARPES) and X-ray photoemission spectroscopy have been used to characterise epitaxially ordered graphene grown on copper foil by low-pressure chemical vapour deposition. A short vacuum anneal to 200 °C allows observation of ordered low energy electron diffraction patterns. High quality Dirac cones are measured in ARPES with the Dirac point at the Fermi level (undoped graphene). Annealing above 300 °C produces n-type doping in the graphene with up to 350 meV shift in Fermi level, and opens a band gap of around 100 meV. [ABSTRACT FROM AUTHOR]
Published: 2013
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Author: Giménez‐Marqués, Mónica, Bellido, Elena, Berthelot, Thomas, Simón‐Yarza, Teresa, Hidalgo, Tania, Simón‐Vázquez, Rosana, González‐Fernández, África, Avila, José, Asensio, Maria Carmen, Gref, Ruxandra, Couvreur, Patrick, Serre, Christian, and Horcajada, Patricia
Published: 2018
Full Text: View/download PDF

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