1. Polystyrene-silicon bonding through π electrons: a combined XPS and DFT study
- Author
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John F. Watts, Marie-Laure Abel, Robert H. Carr, and Sabrina Tardio
- Subjects
Materials science ,Silicon ,Binding energy ,Analytical chemistry ,chemistry.chemical_element ,02 engineering and technology ,Surfaces and Interfaces ,General Chemistry ,010402 general chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Ring (chemistry) ,01 natural sciences ,Molecular electronic transition ,0104 chemical sciences ,Surfaces, Coatings and Films ,Silanol ,chemistry.chemical_compound ,X-ray photoelectron spectroscopy ,chemistry ,Materials Chemistry ,Physical chemistry ,Molecular orbital ,Polystyrene ,0210 nano-technology - Abstract
Silicon wafers, covered with different thickness layers of polystyrene, were analysed by XPS. High resolution spectra of the C1s shake-up satellite, due to the π-π* transition of the aromatic ring, were compared. A shift in the shake-up binding energy represents a change in the electronic transition energy and so in the energy of the molecular orbital. This made it possible to assess and confirm an interaction between the π electrons of the phenyl ring and the silanol groups present on the surface of the silicon. Copyright © 2015 John Wiley & Sons, Ltd.
- Published
- 2015
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