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A new binary compound, NpSe2, possesses metal-chalcogen and chalcogen-chalcogen interactions different from those reported for other metal dichalcogenides. Its structure is incommensurately modulated and features linear Se chains and valence-ambiguous Np cations.

We report high-energy-resolution X-ray absorption spectroscopy detection of ethylene and CO ligands adsorbed on catalytically active iridium centers isolated on zeolite HY and on MgO supports. The data are supported by density functional theory and FEFF X-ray absorption near-edge modelling, together with infrared (IR) spectra. The results demonstrate that high-energy-resolution X-ray absorption spectra near the iridium LIII (2p3/2 ) edge provide clearly ascribable, distinctive signatures of the ethylene and CO ligands and illustrate effects of supports and other ligands. This X-ray absorption technique is markedly more sensitive than conventional IR spectroscopy for characterizing surface intermediates, and it is applicable to samples having low metal loadings and in reactive atmospheres and is expected to have an increasing role in catalysis research by facilitating the determination of mechanisms of solid-catalyzed reactions through identification of reaction intermediates in working catalysts.

For overall water-splitting systems, it is essential to establish O2-insensitive cathodes that allow cogeneration of H2 and O2. An acid-tolerant electrocatalyst is described, which employs a Mo-coating on a metal surface to achieve selective H2 evolution in the presence of O2. In operando X-ray absorption spectroscopy identified reduced Pt covered with an amorphous molybdenum oxyhydroxide hydrate with a local structural order composed of polyanionic trimeric units of molybdenum(IV). The Mo layer likely hinders O2 gas permeation, impeding contact with active Pt. Photocatalytic overall water splitting proceeded using MoOx/Pt/SrTiO3 with inhibited water formation from H2 and O2, which is the prevailing back reaction on the bare Pt/SrTiO3 photocatalyst. The Mo coating was stable in acidic media for multiple hours of overall water splitting by membraneless electrolysis and photocatalysis.

Monolayer MoS2 is a promising semiconductor to overcome the physical dimension limits of microelectronic devices. Understanding the thermochemical stability of MoS2 is essential since these devices generate heat and are susceptible to oxidative environments. Herein, the promoting effect of molybdenum oxides (MoOx) particles on the thermal oxidation of MoS2 monolayers is shown by employing operando X‐ray absorption spectroscopy, ex situ scanning electron microscopy and X‐ray photoelectron spectroscopy. The study demonstrates that chemical vapor deposition‐grown MoS2 monolayers contain intrinsic MoOx and are quickly oxidized at 100 °C (3 vol% O2/He), in contrast to previously reported oxidation thresholds (e.g., 250 °C, t ≤ 1 h in the air). Otherwise, removing MoOx increases the thermal oxidation onset temperature of monolayer MoS2 to 300 °C. These results indicate that MoOx promote oxidation. An oxide‐free lattice is critical to the long‐term stability of monolayer MoS2 in state‐of‐the‐art 2D electronic, optical, and catalytic applications., Operando X‐ray absorption spectroscopy elucidates molybdenum oxide (MoOx) impurities’ effect on the thermochemical stability of monolayer MoS2. The thermal oxidation onset of as‐grown monolayer MoS2 is as low as 100 °C with MoOx present, overestimated by >150 °C in the literature (T ≥ 250 °C, t ≤ 1 h). Removal of MoOx increases the oxidation onset temperature to 300 °C.

A detailed report about the confocal experiment and the corresponding data analysis is presented to determine local atomic concentrations in a thick sample with a micrometer resolution. X-ray emission from a quartz substrate, loaded by aerosol particles, was induced by a scanning proton microbeam and observed by an Si(Li) spectrometer whose field of view was narrowed by a polycapillary lens. A series of X-ray images were recorded at different positions of the sample along the microbeam axis when the particles were driven through the sensitive microvolume. The concentrations reconstructed in three dimensions were used to extract penetration profiles of the strongest X-ray emitters (Fe, Ca, S) in an aerosol sample together with the surface profile of the matrix (Si). The results show exponentially dumped depth profiles with characteristic length depending on particle size. Copyright © 2009 John Wiley & Sons, Ltd.

The investigation of an ancient Chinese ceramic served to further develop and validate fundamental parameter-based quantitation procedures in reference-free x-ray fluorescence (XRF) analysis. The XRF measurements of this sample were performed at the four-crystal monochromator beamline of the Physikalisch-Technische Bundesanstalt (PTB) at the BESSY II synchrotron radiation facility employing different excitation energies. The parallel processing of the XRF spectra recorded at different excitation energies provides a means to simultaneously evaluate relevant fundamental parameters and secondary enhancement processes such as those induced by photoelectrons. Employing well-characterized and absolutely calibrated instrumentation, all experimental parameters involved in XRF are known for small relative uncertainties allowing for a completely reference-free quantitation. Apart from traces of rare earth elements, the analytical results of the Chinese ceramic achieved by reference-free XRF are in line with target values given within a proficiency test of the International Atomic Energy Agency (IAEA) involving atomic and nuclear methods. Copyright © 2008 John Wiley & Sons, Ltd.