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A new analytical model, derived rigorously from scalar diffraction theory, accurately fits soft-x-ray measurements of symmetrical profile gold transmission gratings in all diffracted orders. The calibration system selects numerous photon energies by use of a high-resolution grazing-incidence monochromator and a dc e-beam source. Fine-period free-standing gratings exhibit limited performance and require such testing to determine parameters of and select acceptable gratings for use in time-resolved (0.25 ns) spectrographs of known radiometric response. Unfolded spectra yield a Z-pinch plasma peak kT approximately 250 eV, total radiated energy approximately 900 kJ, and a pinch-driven gold-wall hohlraum Planckian kT approximately 86 eV.

X-ray backlighting and microscopy systems for the 1-10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998)]. We show that high-resolution (or = 10 microm) x-ray backlighting systems using bent crystals can be more efficient than analogous point-projection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10-microm resolution over a 20-mm field of view are presented.