1. Transversal ultrahigh-resolution polarizationsensitive optical coherence tomography for strain mapping in materials
- Author
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Gisela Ahrens, Karin Wiesauer, Rainer Engelke, Erich Goetzinger, David Stifter, Gabi Gruetzner, Michael Pircher, and Christoph K. Hitzenberger
- Subjects
Materials science ,Birefringence ,genetic structures ,medicine.diagnostic_test ,business.industry ,Resolution (electron density) ,Polarimetry ,eye diseases ,Atomic and Molecular Physics, and Optics ,Characterization (materials science) ,Optical axis ,Optics ,Optical coherence tomography ,Nondestructive testing ,medicine ,sense organs ,business ,Refractive index - Abstract
Optical coherence tomography (OCT) and its extension, polarization-sensitive (PS-)OCT, are techniques for contactless and nondestructive imaging of internal structures. In this work, we apply PS-OCT for material characterization. We use a transversal scanning, ultra-high resolution (UHR-)PS-OCT setup providing cross-sectional as well as inplane information about the internal microstructure, the birefringence and the orientation of the optical axis within the material. We perform structural analysis and strain-mapping for different samples: we show the necessity of UHR imaging for a highly strained elastomer sample, and we discuss the effect of large birefringence on the PS-OCT images. Furthermore, we investigate high-aspect ratio photoresist moulds for the production of microelectromechanical parts (MEMS), demonstrating that transversal UHR-PSOCT is a promising tool for non-destructive strain-mapping.
- Published
- 2006
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