1. Comparative study of (111) and (100) crystals and capacitance measurements on Si strip detectors in CMS
- Author
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Manfred Krammer, D. Boemi, U. Biggeri, Paolo Lariccia, T. Tuuva, Marco Meschini, Stephen Watts, Luigi Fiore, G. Viertel, D. Pandoulas, F. Raffaelli, Donato Creanza, Paolo Ciampolini, Giovanna Selvaggi, Alessandro Giassi, Guido Tonelli, Josef Hrubec, Anna Elliott-Peisert, Bruno Wittmer, K. Luebelsmeyer, Marco Pieri, P. Mättig, Salvatore My, A. Fürtjes, Ettore Focardi, A. Buffini, Lutz Feld, M. Lenzi, Piero Giorgio Verdini, Rino Castaldi, A. Caner, M. Giorgi, G. Stefanini, G. Hall, Giancarlo Mantovani, Lucia Silvestris, Suchandra Dutta, A. Giraldo, Sebastiano Albergo, B. Checcucci, S. Braibant, Veikko Karimäki, K. Freudenreich, C. Vannini, Horst Breuker, Werner Lustermann, E. Catacchini, B. Glessing, M. Loreti, Ernesto Migliore, V. Radicci, R. Della Marina, Marcello Mannelli, A. Starodumov, Mika Huhtinen, Z. Xie, R. Hammerstrom, A. Bader, Laura Borrello, P. Tempesta, A. Marchioro, A. Kaminsky, Filippo Bosi, S. Busoni, Dario Bisello, B. Mc Evoy, Raffaello D'Alessandro, G. M. Bilei, Renato Potenza, Andrea Castro, Michel Raymond, M. Da Rold, Carlo Civinini, B. Schmitt, Mara Bruzzi, Alessandro Paccagnella, Nicola Bacchetta, R. Siedling, I. Stavitski, Giuseppe Bagliesi, Patrizia Azzi, Thomas Hebbeker, A. Santocchia, W.H. Gu, L. Servoli, C. Eklund, G. Martignon, Alberto Messineo, Fabrizio Palla, G. Parrini, M.J. French, St. Koenig, Daniele Passeri, K. Skog, Roberto Dell'Orso, Andrea Candelori, S. Piperov, Alessia Tricomi, Giacomo Sguazzoni, M. Angarano, A. Basti, Natale Demaria, Li Yahong, Chiara Mariotti, C. Bozzi, E. Babucci, Giorgio Maggi, M. De Palma, and A. Papi
- Subjects
Physics ,Semiconductor ,Backplane ,business.industry ,Detector ,Optoelectronics ,Substrate (electronics) ,Radiation ,business ,Capacitance ,Silicon microstrip detectors - Abstract
For the construction of the silicon microstrip detectors for the Tracker of the CMS experiment, two different substrate choices were investigated: A high-resistivity (6 k cm) substrate with (111) crystalorientation and a low-resistivity (2k cm) one with (100) crystalorientation. The interstrip and backplane capacitances were measured before and after the exposure to radiation in a range of strip pitches from 60 μm to 240 μm and for values of the width-over-pitch ratio between 0.1 and 0.5.
- Published
- 1999