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Zirconium oxide (zirconia) powder has been synthesized by co-precipitation method. The structural characterization of prepared sample was obtained by X-ray diffraction and showed monoclinic phase. Further surface morphology was confirmed by scanning electron microscopy (SEM). The frequency dependence of dielectric constant, dielectric loss, and impedance of the sample was investigated at room temperature. The obtained results partially motivated for alternative silicon based on devices. [ABSTRACT FROM AUTHOR]

Nanocrystalline Zn1-xMnxS films (x=0.04, 0.08 and 0.12) were deposited on glass substrates at 400 K using a simple resistive thermal evaporation technique. All the deposited films were characterized by chemical, structural, morphological, optical and magnetic properties. Scanning electron microscopy and atomic force microscopy studies showed that all the films investigated were in nanocrystalline form with the grain size lying in the range 10–20 nm. All the films exhibited cubic structure and the lattice parameters increase linearly with composition. The absorption edge shifted from the higher-wavelength region to lower wavelengths with increase in Mn concentration. The magnetization increased sharply with increase of the Mn content up to x=0.08 and then decreased with further increase of the Mn content. Particularly, Zn0.92Mn0.08S concentration samples show a weak ferromagnetic nature, which might be the optimum concentration for optoelectronic and spintronic device applications. [ABSTRACT FROM AUTHOR]