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Your search keyword '"Janusz Rajski"' showing total 3 results
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3 results on '"Janusz Rajski"'

1. Isolation of Failing Scan Cells through Convolutional Test Response Compaction.

Author

Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, and Jerzy Tyszer

Subjects
*TESTING equipment, *MEASURING instruments, *TEST methods, *TESTING
Abstract

Abstract??This paper describes a non-recursive fault diagnosis technique for scan-based designs with convolutional test response compaction. The proposed approach allows a time-efficient and accurate identification of failing scan cells using Gauss?Jordan elimination method. [ABSTRACT FROM AUTHOR]

Published
2007
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2. Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients.

Author

Janusz Rajski and Jerzy Tyszer

Abstract

New tables of primitive polynomials of degree up to 660 over the Galois field of 2 elements are provided. These polynomials have been obtained for ring generators—a new class of linear feedback shift registers featuring enhanced properties over conventional shift registers. For each degree polynomials with five, seven and nine nonzero coefficients are presented. The coefficients are uniformly separated from each other so that the resulting implementations are highly modular. [ABSTRACT FROM AUTHOR]

Published
2003

3. Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

Author

Artur Pogiel, Jĕdrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski, and Brady Benware

Subjects
Scheme (programming language), Engineering, Computer engineering, business.industry, Compression (functional analysis), Real-time computing, Test response, Electrical and Electronic Engineering, business, Fault (power engineering), computer, Field (computer science), computer.programming_language
Abstract

This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression. The scheme is based on a very simple test response compactor employing orthogonal--spatial and time--signatures. The advantage of this scheme as compared to previous work in this field is the simple and incremental nature of the compaction hardware required. The ability of the scheme to accurately identify failing scan cells from compacted responses has been measured on production fail data from five industrial designs and is reported herein.

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